Understanding Semiconductors

Episode 2

Modern metrology from Lab to Fab by Rigaku

A podcast for engineering leaders in characterization, metrology, process, and analytics, looking for discussion around semiconductor metrology challenges.

In this episode: How the semiconductor industry can regain the hearts and minds of innovator

Markus speaks with Todd Younkin, President and CEO at Semiconductor Research Corporation (SRC) about:

• How can the semiconductor industry rejuvenate innovators to think differently about the space? How do we address and fill the talent gap?
• How the industry needs to move beyond Moore's Law and the smaller, cheaper and faster paradigm to inspire and recruit fresh talent?
• A more robust “middle pipeline” that moves ideas to concept to product more effectively.
• The recent geopolitical focus on semiconductors and what that means for the future of global supply chains
• The CHIPS Act

Visit our LinkedIn Semiconductor Metrology Solutions Showcase

Contact Markus Kuhn on LinkedIn for any potential guest requests or episode ideas.

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Host: Markus Kuhn

Ph.D. in Chemistry, University of Western Ontario, Canada BS Honors, University of Western Ontario, Canada. Markus is a semiconductor technology expert with a proven track record in developing, managing, and implementing novel metrology strategies and programs in support of advanced semiconductor process and architectural technology development. During a 25-year career with Intel and Digital Equipment Corporation, Markus was responsible for the development and implementation of a broad range of analytical capabilities to help meet semiconductor technology goals and was a key technical contributor to Intel's breakthrough strain, high K/metal gate, FinFET, and advanced memory programs. Currently, he is a Senior Director for Semiconductor Technology and a Fellow for Rigaku Corporation. His interests include the advancement of analytical capabilities for nanoscale devices, and he has a broader interest in the synergies between analytical characterization methods, machine learning, and process metrology to help enable emerging nanoscale device technologies. He has published 100+ refereed papers and holds 30+ patents relating to semiconductor technology.