Understanding Semiconductors

Episode 1

Modern metrology from Lab to Fab by Rigaku

A podcast for engineering leaders in characterization, metrology, process, and analytics, looking for discussion around semiconductor metrology challenges.

In the debut episode: Markus talks about

• How he became involved in semiconductor technology development
• His motivations behind launching this podcast
• Why the topic of metrology is essential for the semiconductor industry
• How is metrology currently being utilized in the semiconductor industry, and how it can be improved
• Is the future of metrology revolutionary or evolutionary?

Visit our LinkedIn Semiconductor Metrology Solutions Showcase

Contact Markus Kuhn on LinkedIn for any potential guest requests or episode ideas.

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Host: Markus Kuhn

Ph.D. in Chemistry, University of Western Ontario, Canada BS Honors, University of Western Ontario, Canada. Markus is a semiconductor technology expert with a proven track record in developing, managing, and implementing novel metrology strategies and programs in support of advanced semiconductor process and architectural technology development. During a 25-year career with Intel and Digital Equipment Corporation, Markus was responsible for the development and implementation of a broad range of analytical capabilities to help meet semiconductor technology goals and was a key technical contributor to Intel's breakthrough strain, high K/metal gate, FinFET, and advanced memory programs. Currently, he is a Senior Director for Semiconductor Technology and a Fellow for Rigaku Corporation. His interests include the advancement of analytical capabilities for nanoscale devices, and he has a broader interest in the synergies between analytical characterization methods, machine learning, and process metrology to help enable emerging nanoscale device technologies. He has published 100+ refereed papers and holds 30+ patents relating to semiconductor technology.