Learning Hub
Welcome to Learning Hub, your premier online resource for mastering semiconductor metrology techniques and tools. Explore our comprehensive collection of courses and resources tailored to wafer inspection and metrology techniques, with a special focus on X-ray metrology.
Unlock the most reliable solutions to your metrology challenges with our in-depth coverage of advanced X-ray techniques, including:
- WDXRF (Wavelength dispersive X-ray fluorescence)
- TXRF (Total reflection X-ray fuorescence)
- XRR (X-ray reflectometry)
- EDXRF (Energy dispersive X-ray fluorescence)
- CDSAXS (Critical-dimension small-angle X-ray scattering)
- HRXRD (High-resolution X-ray diffraction)
- XRF (X-ray fluorescence)
- XRD (X-ray diffraction)
- XRT (X-ray topography)
Join our dynamic community of learners, engage in discussions, and collaborate with industry experts to expand your skills and stay updated on the latest advancements in semiconductor metrology.
Semiconductor learning resources
Understanding semiconductors a connection with the industry leaders.
Understanding Semiconductors podcast
A podcast designed to connect semiconductor industry experts and engineering leaders in characterization, metrology, process, and analytics, discussing recent semiconductor metrology challenges.
Learn more >Wafer inspection and X-ray metrology techniques
Learn about the most reliable solutions to your metrology challenges: WDXRF, TXRF, XRR, EDXRF, CDSAXS, HRXRD, XRT and XRD
Learn more >Webinar recordings
Watch on-demand recordings of webinars related to the semiconductor industry.
Learn more >Rigaku Journal
Read articles pertaining to semiconductor products and applications in the Rigaku Journal.
Learn more >Subscribe to Understanding Semiconductors newsletter
Connect with semiconductor leaders in metrology, process, and analytics to solve your biggest metrology challenges.
Contact Us
Whether you are interested in getting a quote, want a demo, need technical support, or simply have a question, we're here to help.