Standardless FP Analysis in X-ray Fluorescence (XRF)

X-ray fluorescence (XRF) analysis identifies and quantifies elements in a sample by detecting emitted X-rays. Standardless Fundamental Parameter (FP) analysis enables quantification without reference standards, using theoretical calculations based on physical constants.

Mechanism of standardless FP analysis

Standardless FP analysis estimates the composition of a sample by theoretically calculating the generation, absorption, and scattering of X-rays using fundamental physical constants (Fundamental Parameters). This method enables quantitative analysis without the use of standard reference materials.  

Features and advantages

• No need for standard samples, making it suitable for new or unknown materials.
• Applicable to various samples, including metals, minerals, ceramics, and environmental samples.
• Quick and simple analysis, requiring only sample placement in the instrument.

Limitations

• Lower accuracy compared to standard-based methods.
• Difficulty detecting light elements such as lithium and beryllium.
• Influence of sample conditions, including surface roughness and density variations.

Standardless FP analysis is a fast and versatile method for elemental analysis. However, for high-precision quantification, standard-based calibration may still be required.