Pharmaceutical and Cosmetic Applications
EDXRF analyzers provide a fast, reliable, and non-destructive way to measure the elemental composition of a wide variety of materials, including pharmaceuticals and cosmetics. In the pharmaceutical industry, EDXRF can test for retained spent palladium and other heavy metals, such as unwanted cadmium, lead, mercury, and bromine, in pills and tablets as part of the quality control process. In the cosmetics industry, EDXRF can be used for methods such as measuring the concentration of ZnO in lotions and creams, which can help determine the SPF of these products.
Our EDXRF solutions offer excellent sensitivity and precision for measuring trace-heavy elements and other elements of interest in pharmaceutical and cosmetic products. Our instruments are also capable of supporting compliance with 21 CFR Part 11 regulations. Explore the benefits of using Rigaku EDXRF to ensure the safety and quality of your products.
Benchtop solutions for pharmaceuticals and cosmetics
Benchtop solutions for pharmaceuticals and cosmetics
We offer a comprehensive range of budget-friendly benchtops, whether your needs are for basic screening purposes or more complex applications. All systems provide elemental composition data in minutes and do not need ongoing allocations for expensive consumables and maintenance. Here are some advantages that our systems provide:
- Rapid, non-destructive elemental analysis, beneficial in fast-paced production settings
- Multi-element capabilities, from ultra-low concentrations to percent levels
- Measurement of all elements from sodium (Na) to uranium (U)
- Compliance support for 21 CFR Part 11 regulations using SureDI
- Analysis without standards using RPF-SQX Fundamental Parameters
- Easy sample preparation and no complex setups
- Simple, easy operation, even for non-technical personnel
- Low cost of ownership, self-installed and maintained
SureDI Software for 21 CFR Part 11 Compliance
We offer various software options to help you meet your needs, including SureDI, supporting compliance with 21 CFR Part 11. This option allows organizations in regulated industries, such as pharmaceuticals, to meet FDA requirements confidently.
Advanced Fundamental Parameters Software
Advanced qualitative and quantitative analysis is powered by our RPF-SQX FP software, featuring Rigaku Profile Fitting (RPF) technology and Scattering FP. This software allows semi-quantitative analysis of almost all sample types without standards and rigorous quantitative analysis with standards. Scattering FP automatically estimates the concentration of unmeasurable low atomic number elements (hydrogen to fluorine) and provides appropriate corrections.
Given at least one sample with known concentrations from a referee technique, the software allows you to quickly and easily create a Matching Library. This feature changes the analysis from semi-quant to fully quantitative, tuning your XRF to your specific analysis needs.
Calibration standards can be expensive and difficult to obtain for many applications. With RPF-SQX, the number of required standards is greatly reduced. This option significantly lowers the cost of ownership and reduces your workload requirements.
For routine analysis or quick spot checks NEX QC and NEX QC+
Recommended when you need an affordable system for identifying and quantifying the elemental composition of your materials. These systems feature touchscreen operation and built-in printers for added convenience. They have a small footprint, are transportable, and require no external computer.
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For analysis with QuantEZ NEX QC+ QuantEZ
Recommended when you need a quick, cost-effective solution with a step up in performance. It includes all the features of the NEX QC Series models but is packaged with QuantEZ software. This software simplifies operations and provides a flow bar interface for creating custom methods. RPF-SQX Fundamental Parameters with Rigaku Profile Fitting is available with this system.
For high-performance and small spot analysis NEX DE Series
Recommended when you need expanded analytical capabilities, including higher sample batch throughput, small spot analysis, or enhanced performance for measurement of higher atomic number elements. These systems provide quick elemental identification, screening, and characterization of your samples. RPF-SQX Fundamental Parameters featuring Rigaku Profile Fitting and Scattering FP are available with these systems.
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For challenging and complex applications NEX CG II Series
Recommended when you require higher power and increased sensitivity. These systems are ideal for ultra-low and trace-level performance or complex applications with trace elements and variable base matrices. RPF-SQX Fundamental Parameters featuring Rigaku Profile Fitting and Scattering FP are available with these systems.
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