RoHS/WEEE

EDXRF provides a fast, reliable, and economical solution for determining elemental composition in almost any sample type. Its ability to quickly measure elemental concentrations in a wide range of samples and materials makes it particularly well-suited for ensuring compliance with international regulations such as RoHS and WEEE directives.

RoHS limits the allowable amounts of toxic elements chromium, mercury, lead, bromine, and cadmium in plastics and consumer goods. EDXRF is a recognized analysis technique for rapid screening by XRF and quantification of hazardous elements according to RoHS norms. The technique's versatility and speed make it indispensable for industries looking to ensure product safety and comply with RoHS and other similar regulations.

Learn more about how our benchtop solutions can help you.

RoHS directive sign with Rigaku NEX Series benchtop EDXRF elemental analyzers. These products are used for screening hazardous elements per RoHS norms.

Benchtop solutions

EDXRF can quickly analyze samples for restricted substances without damaging them, making it ideal for quality control and product screening. We offer a range of budget-friendly benchtops, whether your needs are for basic screening or more advanced applications. All systems provide elemental composition data in minutes and do not need ongoing allocations for expensive consumables and maintenance. Here are some advantages that our systems provide:

Rapid, non-destructive elemental analysis, beneficial in fast-paced production settings
Multi-element capabilities, from ultra-low concentrations to percent levels
Measurement of all elements from sodium (Na) to uranium (U)
Multi-application versatility, including polymers, metals, and alloys
Easy sample preparation and no complex setups
Simple, easy operation, even for non-technical personnel
Low cost of ownership, self-installed and maintained

See Application Examples See Recommended Products

Rigaku NEX Series benchtop EDXRF elemental analyzers, including NEX CG II Series, NEX DE Series, and NEX QC Series.

Advanced Fundamental Parameters software

Advanced qualitative and quantitative analysis is powered by our RPF-SQX FP software, featuring Rigaku Profile Fitting (RPF) technology and Scattering FP. This software allows semi-quantitative analysis of almost all sample types without standards and rigorous quantitative analysis with standards. Scattering FP automatically estimates the concentration of unmeasurable low atomic number elements (hydrogen to fluorine) and provides appropriate corrections.

Given at least one sample with known concentrations from a referee technique, the software allows you to quickly and easily create a Matching Library. This feature changes the analysis from semi-quant to fully quantitative, tuning your XRF to your specific analysis needs.

Calibration standards can be expensive and difficult to obtain for newly developed materials. With RPF-SQX, the number of required standards is greatly reduced. This option significantly lowers the cost of ownership and reduces your workload requirements.

Rigaku RPF-SQX Fundamental Parameters - FP Method. Using this software, the number of required calibrations is greatly reduced.

Electronic equipment with element of interest, lead. Read EDXRF App Note 1550 - NEX DE VS - Lead-free Solder.

For routine analysis NEX QC and NEX QC+

Recommended when you need an affordable system for identifying and quantifying the elemental composition of your samples. These systems feature touchscreen operation and built-in printers for added convenience. They have a small footprint and require no external computer, which is ideal for facilities limited in space.

See Product Details

Rigaku NEX QC and NEX QC+ benchtop EDXRF elemental analyzers.

For analysis with QuantEZ NEX QC+ QuantEZ

Recommended when you need a quick, cost-effective solution with a step up in performance. It includes all the features of the NEX QC Series models but is packaged with QuantEZ software. This software simplifies operations and provides a flow bar interface for creating custom methods. RPF-SQX Fundamental Parameters with Rigaku Profile Fitting is available with this system.

See Product Details

Rigaku NEX QC+ QuantEZ benchtop EDXRF elemental analyzer with a desktop computer.

For high-performance and small spot analysis NEX DE Series

Recommended when you need expanded analytical capabilities, including higher sample batch throughput or small spot analysis. These systems provide quick elemental identification, screening, and characterization of your samples. RPF-SQX Fundamental Parameters featuring Rigaku Profile Fitting and Scattering FP are available with these systems.

See Product Details

Rigaku NEX DE Series benchtop EDXRF elemental analyzer with a desktop computer.

For challenging and complex applications NEX CG II Series

Recommended when you require higher power and increased sensitivity. These systems are ideal for ultra-low and trace-level performance. RPF-SQX Fundamental Parameters featuring Rigaku Profile Fitting and Scattering FP are available with these systems.

See Product Details