Benchtop Powder X-ray Diffraction (XRD) Instrument

    Qualitative and quantitative phase analysis of poly-crystalline materials

    The MiniFlex benchtop X-ray diffractometer is a multipurpose powder diffraction analytical instrument that can determine: crystalline phase identification (phase ID) and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to the MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex XRD system decades ago.

    MiniFlex Overview


    X-ray powder diffraction with HPAD detector

    MiniFlex XRD system delivers speed and sensitivity through innovative technology advances, including the HyPix-400 MF 2D hybrid pixel array detector (HPAD) together with an available 600 W X-ray source and new 8-position automatic sample changer.

    Hybrid pixel array detector (HPAD)

    This new direct photon counting detector enables high-speed, low-noise data collection and may be operated in 0D and 1D modes for conventional XRD analysis and 2D mode for samples with coarse grain size and/or preferred orientation.

    XRD accessories enhance your MiniFlex

    A variety of X-ray tube anodes – along with a range of sample rotation and positioning accessories, together with a variety of temperature attachments – are offered to ensure that the MiniFlex X-ray diffraction (XRD) system is versatile enough to perform challenging qualitative and quantitative analyses of a broad range of samples, whether performing research or routine quality control. The new (Gen 6) MiniFlex X-ray diffractometer system embodies the Rigaku philosophy of “Leading with Innovation” by offering the world’s most advanced benchtop system for powder diffractometry.

    Advanced powder diffraction software

    Each MiniFlex comes standard with the latest version of SmartLab Studio-II, Rigaku's full-function powder diffraction analysis package. The latest version offers important new functionality; including a fundamental parameter method (FP) for more accurate peak calculation, phase identification using the Crystallography Open Database (COD), and a wizard for ab inito crystal structure analysis.

    MiniFlex X-ray diffractometer history

    The Rigaku MiniFlex X-ray diffractometer (XRD) is historically significant in that it was the first commercial benchtop (tabletop or desktop) X-ray diffractometry instrument. When introduced in 1973, the original Miniflex™ benchtop XRD was about one-tenth the size, and dramatically less expensive, than conventional X-ray diffraction (XRD) equipment of the period. The original instrument (Gen 1), and its successor that was introduced in 1976 (Gen 2), employed a horizontal goniometer with data output provided by an internal strip chart recorder. The third generation (Gen 3) benchtop diffractometer, introduced in 1995, was called Miniflex+. It provided a dramatic advance in X-ray power to 450 watts (by operating at 30kV and 15mA) and Windows® PC computer control. Both the Miniflex+ and the succeeding generations of bench diffractometers employ a vertical goniometer and allow the use of an automatic sample changer. The fourth generation (Gen 4) Miniflex II benchtop XRD was introduced in 2006 and offered the advance of a monochromatic X-ray source and a D/teX Ultra 1D silicon strip detector. The fifth generation (Gen 5) MiniFlex600 desktop XRD, introduced in 2012, built upon this legacy with 600W of available power and new powder diffraction software.

    MiniFlex Features

    New 6th generation design
    Phase identification
    Compact, fail-safe radiation enclosure
    Phase quantification (phase ID)
    Incident beam variable slit
    Percent (%) crystallinity
    Simple installation and user training
    Crystallite size and strain
    Factory aligned goniometer system
    Lattice parameter refinement
    Laptop computer operation
    Rietveld refinement
    Molecular structure

    MiniFlex Videos

    MiniFlex Specifications

    Technique X-ray diffraction (XRD)
    Benefit Phase analysis of poly-crystalline materials
    Technology Benchtop X-ray diffractometer with advanced detector
    Attributes 600 W X-ray tube, D/teX Ultra silicon strip detector, accepts unusual samples, tabletop form factor
    Options 8-position autosampler
    HyPix-400 MF (2D HPAD) detector
    Graphite monochromator
    Air sensitive sample holder
    ShapeFlex sample holder
    Computer External PC, MS Windows OS, SmartLab Studio-II software
    Dimensions 620 (W) x 722 (H) x 460 (D) mm
    Mass 80 kg (core unit)
    Power requirements 1Ø, 100-240 V 50/60 Hz

    MiniFlex Application Notes

    The following application notes are relevant to this product

    MiniFlex Resources


    X-ray Diffraction Measurements for Battery Research Watch the Recording
    Component Analysis and Standardless Quantitative Analysis for Pharmaceutical Applications Watch the Recording
    In-Depth Overview of the Use of X-ray Diffraction (XRD) in the Investigation of Asbestos and Respirable Silica Watch the Recording
    Analytical Tools for the Cement Industry: Backup with Powerful Benchtop X-ray Fluorescence Spectrometer and X-ray Diffractometer Watch the Recording
    Powder X-ray Diffraction (XRD) for Pharmaceuticals Watch the Recording
    Dissolution Rate Enchancement of Poorly Water Soluble Drugs - Role in XRPD in the Pharmaceutical Formaulation Development Watch the Recording
    The Application of Chemometric and Statistical Analysis Techniques for X-ray Diffraction Data: Quantitative Analysis and Lot Release Watch the Recording
    Introduction of Part 11 Compliant Features in SmartLab Studio II Watch the Recording
    On the Diffraction Line Profiles in the Rietveld Method Watch the Recording
    Quantitative Phase Analysis Based on Rietveld Method for Data Collected on Miniflex600 Watch the Recording

    Rigaku Journal articles

    adobe Quantification analysis of cement materials Read the Article
    adobePowder X-ray Diffraction Basic Course Fourth Installment: Qualitative analysis Read the Article
    adobePowder X-ray Diffraction Basic Course | Third Installment: Sample preparation and measurement conditions to obtain high-quality data Read the Article
    adobeCement analysis by X-ray diffractometry Read the Article
    adobeBenchtop X-ray diffractometer enabling use with HyPix-400 MF two-dimensional detector Read the Article
    adobeEasyX: Powder analysis software / Qualitative and quantitative phase analyses by simple operation Read the Article
    adobeBenchtop X-ray diffractometer MiniFlex300 / MiniFlex600 Read the Article
    adobeMaking high speed, high resolution measurements using MiniFlex II + D/teX Ultra Read the Article
    adobeBenchtop X-ray diffractometer MiniFlex II + D/teX Ultra Read the Article

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    • The speed and simplicity of the machine allows us to immediately analyse samples following production of our research batches, we can then process and review the data within minutes.
      Read more
      Dan Ledger
      CrystecPharma, UK

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