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Powder X-ray Diffraction Basic Course - Eighth Installment: Crystallinity

Kasumi Kihara

Summer 2025 Volume 41, No. 2 , 11-15

In the eighth lecture of the Powder X-ray Diffraction Basic Course, we will describe “Crystallinity.” Crystallinity is a parameter that indicates the degree of crystallinity of a sample, such as a pharmaceutical or polymeric material, and can be estimated from a powder X-ray diffraction (PXRD) pattern. It is defined as the ratio of the crystalline phase to the total weight (crystalline phase+amorphous phase). The percent crystallinity (reported as %crystallinity) is evaluated from the difference in profiles between crystalline and amorphous phases. In this paper, we describe a method for calculating the crystallinity by decomposing peaks using a profile fitting method. This method is performed by separating diffraction peaks from the crystalline phase and haloes due to scattering from the amorphous phase, and using the integrated intensity obtained by profile fitting. This method does not require pure crystalline and amorphous materials. However, the results can be influenced by the analyst’s subjectivity, as the crystallinity varies depending on how the halo is estimated. High reproducibility values can be obtained independent of the analyst by carefully selecting the parameters that determine the background estimation and the peak shape of halo.

Highlights

  • Crystallinity is the fraction of a sample that is crystalline rather than amorphous.
  • In PXRD, sharp peaks come from crystalline regions and a broad halo comes from amorphous regions.
  • Crystallinity can be calculated by separating peak intensity from halo intensity using profile fitting.
  • The biggest challenge is getting a consistent background and halo estimate, especially for highly crystalline samples.
  • Measurement setup matters: holder choice, slit settings, and sample orientation can change the result.

Summary

Crystallinity tells you how much of a material has an ordered crystal structure and how much is disordered, or amorphous. In X-ray diffraction, crystalline material gives sharp diffraction peaks, while amorphous material produces a broad hump called a halo. By separating those two parts of the pattern, you can estimate the percent crystallinity of the sample.

The basic calculation compares the scattering from the crystalline part with the total scattering from both crystalline and amorphous parts. In practice, this is done with profile fitting rather than by just looking at peak heights. That makes the method useful even when crystalline peaks and the amorphous halo overlap, and it can be done without pure crystalline and pure amorphous reference materials.

Accurate results depend heavily on measurement quality and analysis choices. Background scattering from air or the sample holder can interfere with the pattern, and preferred orientation in materials such as fibers or films can distort peak intensities. Reproducibility improves when the background is treated carefully, halo-shape parameters are constrained when needed, and the same fitting approach is applied consistently across samples.

Examples show how this works in real materials: POM was measured at 68% crystallinity, a polypropylene fiber at 50%, HDPE at 72%, and LDPE at 49%.

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