Pair Distribution Function (PDF) and Radial Distribution Function (RDF) analyses can derive atomic distances and atomic coordinates from an X-ray diffuse scattering pattern regardless of the crystallinity of the materials. Therefore, it is possible to perform the analysis for amorphous materials and nanomaterials that present broad peaks called halos.
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Compact X-ray diffractometer for quality control of materials that is easy to use and is ideal for routine work
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
Windows®-based software suite for Rigaku's X-ray diffractometers