Background
Pair Distribution Function (PDF) and Radial Distribution Function (RDF) analyses can derive atomic distances and atomic coordinates from an X-ray diffuse scattering pattern regardless of the crystallinity of the materials. Therefore, it is possible to perform the analysis for amorphous materials and nanomaterials that present broad peaks called halos.
XRD products from Rigaku
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Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
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2D X-ray detector with latest semiconductor technology designed for home lab diffractometers