HyPix-3000
Compact Photon Counting X-ray Detector
Rigaku’s HyPix-3000 is a next-generation two-dimensional semiconductor detector designed specifically to meet the needs of the home lab diffractionist. One of the HyPix-3000’s unique features is its large active area of approximately 3000 mm² with a small pixel size of 100 μm², resulting in a detector with high spatial resolution. In addition, the HyPix-3000 is a single photon counting X-ray detector with a high count rate of greater than 10⁶ cps/pixel, a fast readout speed and essentially no noise.
HyPix-3000 Overview
Unprecedented Flexibility
Featuring a double-threshold (window) discriminator, the HyPix-3000 has three readout modes that can be selected based on the purpose of a measurement. “Differential” mode can be used to suppress fluorescence from elements in a sample or background derived from cosmic rays. “31-bit” mode is used for experiments in which a very wide dynamic range is needed. “Zero dead time” mode makes it possible to perform extremely fast data collection.
Easy to Use; Easy to Maintain
The HyPix-3000 was designed for optimal flexibility and minimal maintenance. For example, the compact angular enclosure was designed to allow excellent high angle accessibility. Compared to the design of other types of detectors, the HyPix-3000 is essentially maintenance free. Unlike other types of detectors, it does not require an external cooling device as required on CCD detectors, or gas exchange and anode wire washing as required on multi-wire detectors.
HyPix-3000 Features
HyPix-3000 Videos
HyPix-3000 Specifications
| Technique | Powder X-ray diffraction | |
|---|---|---|
| Benefit | Fast, sensitive photon counting detector | |
| Technology | Hybrid Photon Counting (HPC) X-ray detector | |
| Attributes | Air-cooled HPC detector | |
| Computer | External PC, MS Windows® OS | |
| Dimensions | 147 (W) x 93 (H) x 180 (D) (mm) | |
| Mass | 2 kg approx. (core unit) | |
| Power requirements | 1Ø, 100-240 V, 15 A | |
HyPix-3000 Application Notes
The following application notes are relevant to this product
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B-XRD1143 - Verifying the Validity of Crystallite Sizes Determined by the FP Method
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B-XRD1131 - Structural Characterization of Zeolite by PDF Analysis
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B-XRD1112 - Structural Analysis of Amorphous Silica by PDF Analysis
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B-XRD1123 - Simultaneous Operando XRD Measurement for Positive and Negative Electrode Materials
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B-XRD1080 - Rietveld Analysis of Battery Material using a Mo Source
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B-XRD1118 - Quick Pole Figure Measurement of a Metal Material using 2DD
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B-XRD2023 - Phase Identification of an Organic Thin Film by GIWAXS Measurement with a 2D detector
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B-XRD1103 - Phase Identification of a Coarse-grained Trace Component in a Mineral Powder using 2D XRD
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B-XRD2020 - Phase ID and Orientation Analysis for Thin Film SOFC Material using 2DD
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B-XRD1137 - Phase ID Analysis of Micro-impurities on the Surface of a Tablet by Micro-area XRD Measurements
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B-XRD1124 - Operando Transmission XRD Measurement of All-solid-state Lithium-ion Battery using Ag Source
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B-XRD1116 - Operando Measurement of Laminated Lithium-ion Battery using 2DD
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B-XRD2032 - Observation of Orientation State of Polypropylene Film Products by 2D-GIWAXS Measurement
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B-XRD1135 - Observation of Butter Crystal by Simultaneous XRD-DSC Measurement
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B-XRD1117 - Observation of a Phase Transition at High Temperature under Various Atmospheres
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B-XRD1089 - Micro-area Mapping Measurement of Printed Circuit Boards
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B-XRD1107 - Material Characterization by PDF and RDF Analysis
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B-XRD1105 - High-speed in-situ Measurement of Melting Process of Metal
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B-XRD2021 - High-speed RSM of an Epitaxial Film by 1D Detection Mode
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B-XRD2024 - High-speed RSM of a III-nitride Epitaxial Film by 1D Detection Mode
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B-XRD1122 - Evaluation of the Crystallinity of a Carious Tooth using X-ray Diffraction
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B-XRD1104 - Evaluation of Grain Condition and Orientation of Cemented carbide using 2D XRD
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B-XRD1108 - Direct Observation of Melting and Crystallization of Fresh Cream
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B-XRD1126 - Crystallization of Chocolate Observed by XRD-DSC
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B-XRD1044 - Crystal Phase Identification of Carbide Tips by Micro-area 2D X-ray Diffraction
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B-XRD1106 - Charge/discharge Process of Li-ion Battery Positive Electrode
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B-XRD1139 - Calculation of Molecular Stacking Spacing of Copper Phthalocyanine using PDF Analysis
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B-XRD2025 - Analysis of Uniaxially Oriented Film by Wide-range RSM
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B-XRD2026 - Analysis of Epitaxial Films on In-plane Anisotropic Substrates by Wide-Range RSM
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B-XRD2034 - Twist Width Evaluation of Group III-V Nitride Films by Rocking Curve Measurement
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B-XRD2028 - Off-normal Fiber Texture Analysis by Pole Figure Measurement
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B-XRD2030 - Evaluation of Uniformity of Thin Film Thickness by X-ray Reflectivity Mapping
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B-XRD2027 - Evaluation of Uniformity of a Single Crystal Substrate by Rocking Curve Measurement
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B-XRD2031 - Evaluation of Curvature of a Single Crystal Substrate by Rocking Curve Measurement
HyPix-3000 Resources
Rigaku Journal articles
 Applications of the two-dimensional detector HyPix-3000 in X-ray diffractometry |
Read the Article |
| Evaluation of crystalline polymer materials using a 2D-SAXS/WAXS system |
Read the Article |
| GI-XRD measurements of thin film samples using a 2D detector and 2D-SAXS/WAXS attachment |
Read the Article |
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