Background
The chemistry of metal-organic framework microcrystals (MOFs) very often produces a crystalline material that is not suitable for standard single crystal diffraction (SCX). Although quality may be improved by recrystallization, sometimes this is not possible, especially when thermal activation processes were used during MOF preparation. A mixture of powder, amorphous material, polycrystalline compounds and microcrystals is a common outcome, which makes MOFs challenging materials both for SCX or PXRD structure determination approaches.
Thanks to very bright microfocus PhotonJet(Cu) sources and Rigaku’s HyPix detector technology used in the latest generation of XtaLAB Synergy, “What is this?” (WIT) screening can be used to find suitable single crystals for structure solution.
