The taste and texture of butter are vulnerable to temperature change. Many researchers in the food industry point out that control of the lamellar structure and the sub-lattice structure of butter crystal is needed in order to produce butter with rich taste regardless of the storage temperature. Simultaneous X-ray diffraction and DSC measurement (XRD-DSC) facilitates the determination of the onset temperature at which crystallization and melting begin, and the identification of the crystal structure. Here, temperature changes of the lamellar and sub-lattice structures, which affect the taste and texture of butter are investigated by XRD-DSC measurements.
XRD products from Rigaku
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Compact X-ray diffractometer for quality control of materials that is easy to use and is ideal for routine work
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers