Background
Metal nanoparticles exhibit different characteristics from bulk bodies due to the size effect. At this time, it is possible to produce outstanding characteristics by achieving uniform particle size and variation. Observation using a transmission electron microscope (TEM) is a widely known method for investigating the size and variation of particles on the nano size level. However, this method requires considerable time and labor to determine factors such as the average structure or particle diameter distribution. If the small-angle X-ray scattering method is used, the average structure (particle diameter distribution) can be determined in a time ranging from a few minutes to about 1 hour.
XRD products from Rigaku
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
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Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers