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1-, 2-, 3-, 4-, 5-day, options available. See registration form and class outline for specifics.
Course description
DAY ONE (9:00 a.m. to 5:00 p.m.)
- Basic operation of SmartLab diffractometer
- X-ray diffraction and instrumentation
- High resolution XRD for single crystals and epitaxial films
- High resolution XRD method
- High resolution XRD measurement techniques
- High resolution XRD epitaxial layer structure analysis
DAY TWO (9:00 a.m. to 5:00 p.m.)
- X-ray reflectometry
- X-ray reflectometry method
- X-ray reflectometry measurement techniques
- X-ray reflectometry film structure analysis
- In-plane XRD
- In-plane measurement theory
- In-plane grazing incidence XRD thin film measurements
- Grazing incidence XRD
- Traditional grazing incidence XRD thin film measurements
- Rocking Curve and Reciprocal space mapping
- Rocking curve film structure analysis
- Small angle X-ray scattering
- Small angle X-ray scattering method
- Small angle X-ray scattering measurement techniques
- Small angle X-ray scattering particle size analysis
DAY THREE AM (9:00 a.m. to 5 p.m.)
- Powder diffraction
- Powder diffraction method
- How to select right geometry and measurement conditions
- Understanding sources of errors
- Residual stress
- Residual stress measurement techniques
- Residual stress analysis
- Pole figure
- Pole figure measurement techniques
- Pole figure preferred orientation analysis
DAY FOUR (9:00 a.m. to 5:00 p.m.)
- PDXL / SmartLab Studio II powder plugin details
- Basic powder diffraction data treatment
- Search/Match: Identifying phases, tools and techniques to aid your search
- Profile Fitting techniques/ crystallite size/ % crystallinity (if appropriate)
- Easy Quant using RIR relative intensity ratio method
- Easy quant using calibration curves
- Whole Pattern Fitting/ Rietveld analysis—quantitation
DAY FIVE (9:00 a.m. to 5:00 p.m.)
- Overview of Rietveld Basic Operations
- Specific Topics also covered
- Background Model Parameters-polynomial versus user defined backgrounds
- Interpretations of statistical and graphical displays of refinements
- Refinement operation using structure-less phases
- Automatic atomic coordinates linking (cif, csf)
- Internal standard calibrations for 2θ reference
- Easy instrument properties modification- sample displacement shift theta compensating slits, thin film absorption, cylindrical specimen, etc.
- Solid solution substitutions and site occupancy refinements
- Rotating 3-D structure viewing and stereo projections
- Interactive links to Search/Match for residual unmatched area
- Constraints on Variables
- Multiple data regions can be excluded (i.e. Sample holder or substrate reflections)
- Preferred orientations corrections
- Individual FWHM profile shape fitting for turbostatic effects.
- Lattice/crystal structure parameters
- Selective use of phases in refinement (phases included or excluded from refinements)
Customer site software and instrument training course:
- Convenience of your own site for training
- Custom designed to accommodate your instrument
- Custom designed to cater to your staff
- From two to five days of individual attention from expert trainers
Please contact Michelle Goodwin at (281) 362-2300 ext. 122 to schedule training today!