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XES Chimica

X-ray Emission Spectroscopy (XES) is a technique that enables quantitative analysis of the chemical states of elements. By examining spectral chemical shifts and profile variations, it provides information on valence states and compound forms.

XES is not limited to surface or micro-area analysis, therefore it is effective for evaluating the chemical and valence states of materials as a whole. In addition, XES enables chemical and valence state analysis in a standard laboratory environment without the need to use a synchrotron facility. This means that XES can be used for routine chemical state evaluation in research and development.

Rigaku’s X-ray emission spectrometer, XES Chimica, is equipped with a newly developed optical system that further enhances reproducibility and reliability. The system incorporates automatic spectroscopic crystal exchange, automated sample exchange, and software for quantitative analysis, combining operability with practicality.

XES Chimica supports a wide variety of applications, including battery materials and catalysts.

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XES Chimica Overview

Easy, quantitative bulk chemical state analysis—anytime, in the laboratory

XES measures fluorescent X-rays with high energy resolution, capturing spectral variations arising from chemical bonding states. By analyzing chemical shifts and profile changes in the acquired spectra, XES enables the determination of valence states, chemical composition, and compound forms of elements.

XES is effective for evaluating the valence states and chemical states of materials as a whole, rather than being limited to surface or micro-area analysis. In addition, XES enables chemical and valence state analysis in the laboratory without the need to use a synchrotron facility.

Designed for high precision and efficiency

XES Chimica is equipped with a newly developed optical system that enhances reproducibility and reliability. The system incorporates automatic spectroscopic crystal exchange, automated sample exchange, and software for quantitative analysis, combining operability with practicality.

Integrated software supports measurement and analysis

Even without specialized knowledge, users can simply select the elements to be measured and the system performs the analysis. The dedicated GUI allows smooth, detailed data analysis.

Automated quantification system

Pre-configured quantitative applications, including measurement conditions, analysis parameters, and calibration curves, allow automatic quantification of analytical results such as valence states and compositional ratios.

This enables quantitative evaluation of changes in chemical states, rather than simply identifying changes in the spectra.

Lithium-ion battery applications

XES is an effective method for quantitatively evaluating changes in the chemical and valence states of lithium-ion battery materials. XES analysis has been applied to a wide range of battery materials, including:

    • NCM (Lithium Nickel Cobalt Manganese Oxide) cathodes
    • LFP (Lithium Iron Phosphate) cathodes
    • Silicon-based anodes
    • Lithium–sulfur batteries
    • LPS sulfide-based solid electrolytes

XES Chimica Features

Quantitative analysis of valence states, chemical compositions, and compound forms
XES analyzes the valence states, chemical compositions, and compound forms of elements based on chemical shifts and profile changes in spectra arising from chemical bonding states. Its high signal intensity makes it well suited for quantitative analysis. Average valence states can be determined using calibration curves of peak energy versus valence state, while component analysis can be performed by linear combination fitting using reference spectra.
Chemical state analysis anytime in the laboratory, without using a synchrotron facility
XES provides chemical state information similar to that obtained by X-ray Absorption Spectroscopy (XAS) without the need to use synchrotron radiation. Measurements of valence states and chemical states can be performed in the laboratory whenever needed, without having to work around synchrotron facility schedules, making XES useful for routine material evaluation in research and development.
Bulk-averaged chemical state analysis, beyond surface information
The XES analysis region covers an area approximately 10–20 mm in diameter and a depth ranging from several to several tens of micrometers. Unlike XPS, which analyzes microscopic regions on the outermost surface, XES provides bulk-averaged chemical state information. This makes it useful for evaluating the average state of materials, including samples with highly reactive surfaces or non-uniform compositions.
High-resolution, highly reproducible chemical state analysis across a wide range of elements
The newly developed double-crystal spectroscopic optical system combines high-resolution spectra with excellent reproducibility. Up to three analyzer crystals can be installed and automatically switched according to the element being analyzed. The system supports a wide range of elements from oxygen (O) to uranium (U) and can also be used for soft X-ray analysis, including O Kα and Fe Lα.
Efficient continuous measurement and automatic calibration of multiple samples
The six-sample turret enables automatic sample exchange and continuous measurement of multiple samples. The system also supports automatic calibration, with calibration results automatically applied to quantitative analysis. This streamlines the workflow from measurement through quantification when comparing multiple samples or experimental conditions in materials research.
Software support from measurement to quantification of valence states and composition ratios
Even without specialized knowledge, users can set measurement conditions simply by selecting the element to be measured. The dedicated GUI supports data analysis including energy calibration, spectral fitting, and linear combination fitting. In addition, quantitative applications with predefined measurement conditions, analysis parameters, and calibration curves provide an integrated workflow from measurement and automated analysis to automated quantification and result display, enabling the determination of valence states and composition ratios.

XES Chimica Specifications

X-ray generator X-ray tube End window type, Rh target 4 kW
Spectrometer System Double-crystal spectrometer
Angular range (2θ) 40–148°
Step size 0.0001、0.0005、0.001、0.002、0.005、0.01、0.05°/step
Crystal exchanger 3 crystal automatic exchange mechanism
Analyzing crystal Si (220), Ge (220), Ge (111), InSb (111), ADP (101), (TAP (001): Soft X-ray analysis option)
Analysis area diaphragm 20, 10 mm in diameter
Measurement Environment Vacuum
Counting system Detector F-PC (Gas flow type proportional counter)
SPC LE (Gas shield type proportional counter: No PR gas required) (Optional Features)
Sample size Single-sample holder, 6-sample turret 50 mm D x 50 mm W x 5 mm H
35 mm D x 35 mm W x 5 mm H
 
Power 3 phase AC200 V 40A, 
Single phase AC220–240 V, 40A (Optional Features)
Single phase AC100–240 V 15 A (PC)
Cooling water Temperature: Lower than 30℃, Pressure: 0.29–0.49 MPa, Flow: More than 5 L/ min, Quality: Equivalent to drinking water
Gas for F-PC P-10 gas: Ar 90%, Methane 10%, mixture gas
Gas pressure: 0.15 MPa, Gas flow: 7 ml/min
Room temperature 23–27℃ (with daily variation within ±1 ℃)

 

XES Chimica Application Notes

The following application notes are relevant to this product

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