High-Resolution Energy Dispersive X-ray Fluorescence (EDXRF) Spectrometer

Elemental analysis of solids, liquids, powders, alloys and thin films

As a premium high-performance benchtop energy dispersive X-ray fluorescence (EDXRF) elemental spectrometer, the new Rigaku NEX DE delivers wide elemental coverage with a easy-to-learn Windows-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids, slurries and thin films.

NEX DE Overview

XRF elemental analysis in the field, plant or lab

Especially designed and engineered for heavy industrial use, whether on the plant floor or in remote field environments, the superior analytical power, flexibility and ease-of-use of the NEX DE adds to its broad appeal for an ever expanding range of applications, including exploration, research, bulk RoHS inspection, and education, as well as industrial and production monitoring applications. Whether the need is basic quality control (QC) or its more sophisticated variants — such as analytical quality control (AQC), quality assurance (QA) or statistical process control like Six Sigma — the NEX DE is the reliable high performance choice for routine elemental analysis by XRF.

XRF with 60 kV X-ray tube and SDD detector

The 60 kV X-ray tube and Peltier cooled silicon drift detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (60 kV), along with high emission current and multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD).

XRF options: autosampler, vacuum, helium and standardless FP

Options include fundamental parameters, a variety of automatic sample changers, sample spinner and helium purge or vacuum atmosphere for enhanced light element sensitivity.

NEX DE Features

Non-destructive elemental analysis for sodium (Na) to uranium (U)
Powerful and easy-to-use QuantEZ software with multilingual user interface
Solids, liquids, alloys, powders and thin films
60 kV X-ray tube for wide elemental coverage
High-performance SDD for superior data
Multiple automated tube filters for enhanced sensitivity
Unmatched performance-to-price ratio
Advanced RPF-SQX Fundamentals Parameters software featuring Rigaku Scattering FP
See Specifications for options

NEX DE Videos

NEX DE Specifications

Technique Direct excitation energy dispersive X-ray fluorescence (EDXRF)
Benefit High-performance results when analysis time or sample throughput is critical; analyze solids, liquids, powders, coatings, and thin films
Technology Energy dispersive XRF (EDXRF) using high-performance silicon drift detector (SDD)
Attributes 60 kV 12 W X-ray tube with automated tube filters, high-performance SDD, analyze Na to U
Software QuantEZ for control of spectrometer functions and data analysis
Options Vacuum, helium purge, automatic sample changers, single-position sample spinner, external PC with Microsoft® Windows® operating system, UPS, RPF-SQX Fundamental Parameters with Rigaku Scattering FP, SureDI support for 21 CFR Part 11 compliance, other software features
Dimensions 356 (W) x 260 (H) x 351 (D) mm
Mass Approx. 27 kg (core unit)
Power requirements 1Ø, 100 – 240 V, 1.5 A (50/60 Hz)

NEX DE Application Notes

The following application notes are relevant to this product

NEX DE Resources


A Non-Destructive XRF Technique for Rapid and Easy Screening of Residual Catalysts in APIs and Intermediates Watch the Recording
The Use of Easy XRF Elemental Analyses Techniques to Support the Development of Pharmaceutical Formulations Watch the Recording
Quality control of API potency, excipient blend uniformity, and heavy metals impurities by non-destructive and direct analysis of intact pills by XRF Watch the Recording

Rigaku Journal articles

adobeForeign material analysis using energy dispersive X-ray fluorescence spectrometers Read the Article
adobeX-ray fluorescence analysis of halogen elements Read the Article

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