NEX DE Series

Empowering your analysis with high-performance EDXRF 

The NEX DE and NEX DE VS models deliver high-performance results when analysis time or sample throughput is critical. They are designed for speed and precision, important for high-volume analytical labs or fast-paced settings. 

They have a 60 kV, 12 W X-ray tube, single and multilayer tube filters, and a high-performance silicon drift detector (SDD) that supports count rates over 500K cps. The high-count rates provide low limits of detection and excellent spectral resolution, and high-throughput measurements are obtained with various interchangeable automatic sample changers. These features enable high-precision analytical results in the shortest possible measurement times.  

Additionally, these instruments are packaged with QuantEZ software designed to simplify method development and maximize your time. The intuitive instrument control, simple menu navigation, and EZ Analysis interface streamline routine operations and allow you to create new methods using a simple flow bar wizard. These systems are well-suited for exploration, research, bulk RoHS inspection, education, forensics, and industrial and production monitoring applications. 

Small spot EDXRF measurements 

For your small spot analysis needs, the NEX DE VS model features a high-resolution camera and automated collimators to allow for precise positioning of samples to analyze 1 mm, 3 mm, and 10 mm spot sizes. The instrument’s large sample chamber accommodates samples up to 30 cm in diameter and 10 cm tall, and the Point Analysis interface and integrated backlit camera allow easy sample positioning. NEX DE VS is an excellent option for measuring coatings on smaller parts, screening small samples for electronic waste initiatives, or investigating the identification of foreign matter of unknown composition.