Elemental Analysis for Geological Applications
EDXRF spectrometers provide a fast, reliable, and cost-effective solution for determining elemental composition in almost any sample type. Their ability to deliver quick, multi-element analyses for a wide range of geological samples makes them invaluable for applications like mud logging, mineral and hydrocarbon exploration, and rare earth element (REE) characterization.
Whether you are analyzing drill cuttings at the well site or evaluating lateritic clay for REEs, our EDXRF instruments make it easy to analyze and adapt to various geological applications. They can handle a wide variety of materials, like rocks, minerals, and ores, while maintaining reliability and ease of use, even for challenging sample types with trace elements and variable matrix effects.
Learn more about our EDXRF solutions for your geological analysis needs.
Benchtop solutions for geological applications
We offer a comprehensive range of budget-friendly benchtops, whether your needs are for basic screening purposes or more complex applications. All systems provide elemental composition data in minutes and do not need ongoing allocations for expensive consumables and maintenance. Here are some advantages that our systems provide:
- Rapid, non-destructive elemental analysis, beneficial in fast-paced production settings
- Multi-element capabilities, from ultra-low concentrations to percent levels
- Measurement of all elements from sodium (Na) to uranium (U)
- Analysis without standards using RPF-SQX Fundamental Parameters
- Multi-application versatility, including rocks, minerals, sediments, and soils
- Easy sample preparation and no complex setups
- Simple, easy operation, even for non-technical personnel
- Low cost of ownership, self-installed and maintained
Advanced Fundamental Parameters software
Advanced qualitative and quantitative analysis is powered by our RPF-SQX FP software, featuring Rigaku Profile Fitting (RPF) technology and Scattering FP. This software allows semi-quantitative analysis of almost all sample types without standards and rigorous quantitative analysis with standards. Scattering FP automatically estimates the concentration of unmeasurable low atomic number elements (hydrogen to fluorine) and provides appropriate corrections.
Given at least one sample with known concentrations from a referee technique, the software allows you to quickly and easily create a Matching Library. This feature changes the analysis from semi-quant to fully quantitative, tuning your XRF to your specific analysis needs.
Calibration standards can be expensive and difficult to obtain for newly developed materials. With RPF-SQX, the number of required standards is greatly reduced. This option significantly lowers the cost of ownership and reduces your workload requirements.
For routine analysis or quick spot checks NEX QC and NEX QC+
Recommended when you need an affordable system for identifying and quantifying the elemental composition of your materials. These systems feature touchscreen operation and built-in printers for added convenience. They have a small footprint, are transportable, and require no external computer
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For analysis with QuantEZ NEX QC+ QuantEZ
Recommended when you need a quick, cost-effective solution with a step up in performance. It includes all the features of the NEX QC Series models but is packaged with QuantEZ software. This software simplifies operations and provides a flow bar interface for creating custom methods. RPF-SQX Fundamental Parameters with Rigaku Profile Fitting is available with this system.
For high-performance and small spot analysis NEX DE Series
Recommended when you need expanded analytical capabilities, including higher sample batch throughput, small spot analysis, or enhanced performance for measurement of higher atomic number elements. These systems provide quick elemental identification, screening, and characterization of your samples. RPF-SQX Fundamental Parameters featuring Rigaku Profile Fitting and Scattering FP are available with these systems.
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For challenging and complex applications NEX CG II Series
Recommended when you require higher power and increased sensitivity. These systems are ideal for ultra-low and trace-level performance or complex applications with trace elements and variable base matrices. RPF-SQX Fundamental Parameters featuring Rigaku Profile Fitting and Scattering FP are available with these systems.
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