SmartLab Multipurpose X-ray Diffractometer Precision, Flexibility, and Control for Advanced XRD Applications
Multipurpose X-ray Diffractometer (XRD): SmartLab
You control the measurement and workflow, so you can optimize for the precision your research demands.
The Rigaku SmartLab, powered by SmartLab Studio II software, gives you direct control over complex X-ray diffraction measurements. Its modular design lets you adapt the instrument to various advanced applications, while the software allows you to build, refine, and automate your own experimental procedures optimized for high-quality data.
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Comprehensive measurement capabilities: Supports powder diffraction, thin film analysis, grazing incidence diffraction, reflectivity, high-resolution rocking curves, reciprocal space mapping, residual stress measurements, pole figure/texture analysis, micro diffraction, pair distribution function analysis, 2D SAXS/WAXS, in-situ, and operando measurements.
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Automatic optics alignment: The system automatically fine-tunes all X-ray optical components to ensure optimal performance for every configuration. A detailed alignment report is generated for data management and traceability. You never have to wonder if the optics were perfectly aligned.
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User-defined automation: With SmartLab Studio II software, you can create and automate custom measurement and analysis protocols, maintaining full control over experimental parameters while automating complex processes to save you time.
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Modular hardware configuration: Easily switch between different measurement setups with a variety of optics and attachments. All components are sensed, preventing operator errors.
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Regulatory Compliance: Meets MHRA and EMA guidelines, as well as CFR Part 11, GMP, and ASTM E975 standards.
Find the Right Fit for Your Application
Tell us about your samples, measurement goals, and workflow. Our XRD team can help you determine which SmartLab configuration best fits your application and research needs.
Applications
The SmartLab can be configured for a wide variety of measurements in minutes.
- Powder diffraction, phase identification, quantitative analysis, Rietveld analysis
- Thin film grazing incidence diffraction
- Reflectivity
- High-resolution rocking curve and reciprocal space map measurements
- Residual stress measurements
- Pole figure/texture measurements
- Micro diffraction
- Pair distribution function analysis
- 2D SAXS/WAXS
- In-situ measurements
- Operando measurements
See why users love the SmartLab
What our customers are saying about their user experiences
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I'd strongly recommend the system: it truly is easy to get to grips with, even for a non-specialist. The software guidance and simple hardware fittings are a game-changer for hands-on use.
Read moreJoseph WrightUniversity of East Anglia -
Big advantage of SmartLab is in simple and rapid change between individual diffractometer configurations followed by automated and reliable optics and sample alignments. This possibility together with high photon flux of rotating anode source significantly increased the throughput of our laboratory, increased the number of measured samples together with the high quality of measured data.
Read moreMilan DopitaCharles University -
The big advantages of the instrument are especially the in-plane arm, allowing for non-coplanar X-ray diffraction measurements without tilting the sample, and easy procedures for X-ray optics exchange and realignment.
Read moreOndřej CahaMasarykova univerzita -
At TUM, the SmartLab X-ray diffractometer has become an essential part of our daily research activities. The SmartLab has also become the most-used instrument in our group.
Read moreSonja MatichEngineerWalter Schottky Institute, Center for Nanotechnology and Nanomaterials, TUM -
In our technological environment, especially in semiconductor applications, there is a strong need for advanced thin film characterization. The SmartLab’s high-brilliance rotating anode source, combined with versatile 1D and 2D detectors and in-plane diffraction capabilities, makes it an essential tool for our research.
Read moreDr. Frédéric FillotX-ray & Materials AnalysisCEA-Leti & PFNC, Grenoble, France