DicifferX Microarea Edition

Microarea X-ray diffractometer

Bringing microarea XRD into everyday R&D, failure analysis and quality evaluation

Purpose-built to overcome the technical challenges of microarea measurement, the DicifferX Microarea Edition delivers reliable diffraction data even from microareas measuring 100 μm or less across. It brings microarea XRD—previously difficult with conventional laboratory systems—into your own lab, enabling measurements whenever needed and accelerating workflows in R&D, failure analysis, and quality evaluation.

  • High Intensity
    • High diffraction intensity, even from microareas
  • High Precision
    • Precise irradiation for measurements down to a few tens of micrometers
  • High Efficiency
    • Efficient data acquisition with a 2D detector
DicifferX Microarea Edition_02_800×610 DicifferX Microarea Edition_01_800×610

DicifferX Microarea Edition Overview

Making microarea XRD routine in Your lab

Growing demand for microarea evaluation

As electronic devices become smaller, components such as multilayer ceramic capacitors (MLCCs) continue to be miniaturized and more densely integrated. This trend is driving increased demand for evaluating the physical properties of microareas only a few tens of micrometers in size.

Challenges of conventional laboratory microarea measurement

In conventional laboratory XRD systems, reducing the X-ray beam size leads to a significant loss of intensity. In addition, even slight mechanical deflection can shift the X-ray beam away from the targeted microarea. As a result, measuring microareas 100 μm or less across has traditionally been difficult, and reliance on synchrotron facilities has been common.

A new approach to laboratory microarea XRD

The DicifferX Microarea Edition is an X-ray diffraction system optimized for high-precision microarea measurement. It integrates a high-brilliance X-ray source, fixed incident optics, a high-precision multi-axis goniometer, and axis intersection correction to overcome the technical challenges of conventional microarea XRD.

Measure when and where you need it

High-precision microarea measurements that have often relied on external facilities can now be performed in your own laboratory, whenever needed.

DicifferX Microarea Edition Features

Precise and stable X-ray targeting for microarea measurement
The DicifferX Microarea Edition adopts a beamline-like architecture with a fixed incident X-ray source, maintaining a stable X-ray beam position throughout the measurement.
In microarea XRD, where extremely high precision is required, even slight deflection of the arm supporting the X-ray tube can shift the X-ray beam away from its intended position. By structurally minimizing the sources of such displacement and precisely irradiating the targeted area, the system delivers highly reliable diffraction data.
Goniometer optimized for microarea measurement with axis intersection correction
A high-precision multi-axis goniometer designed specifically for microarea measurement, together with an axis intersection correction function, achieves axis intersection accuracy of ±10 μm or better.

Position deviations that cannot be fully compensated for by mechanical precision alone are corrected by software, maintaining high positional accuracy even when the sample is tilted. This enables accurate measurement of microareas only a few tens of micrometers in size.
High-intensity microbeam with a high-brilliance X-ray source and multilayer focusing mirror
Reducing the X-ray beam size causes diffraction intensity to decrease with the irradiated area.

The DicifferX Microarea Edition combines a high-brilliance point-focus X-ray source with a multilayer focusing mirror to deliver approximately 100 times the X-ray intensity in the high-resolution configuration and approximately 330 times in the high-intensity configuration, compared with a general-purpose XRD system.
Efficient microarea data acquisition with a 2D detector
The HyPix-3000 2D detector, with its wide detection area, enables fast, high-intensity measurement and efficient acquisition of diffraction data from microareas.

Simultaneous acquisition of data in both the 2θ direction and the circumferential (β) direction supports applications such as pole figure measurement, residual stress evaluation, and multipoint mapping.

In addition, 2D scanning accumulates measurement data over a wide angular range, enabling qualitative and quantitative evaluation of small discolored areas, foreign materials, and other localized features.

DicifferX Microarea Edition Specifications

Product name / Edition DicifferX Microarea Edition
Technique Microarea X-ray diffraction (Micro XRD)
Applications Crystallinity evaluation, phase identification, orientation analysis, residual stress measurement
Technologies Optics optimized for microarea XRD, dedicated microarea goniometer, axis intersection correction
Major components RA-Micro7 HFE rotating-anode generator, VariMax Mirror HF, HyPix-3000 Compact Photon Counting 2D X-ray Detector, sample observation camera
Control PC External PC, Microsoft Windows®, DicifferX control software
Dimensions 1,450 (W) mm x 1,850 (H) mm x 1,100 (D) mm
Weight (Main unit) Approx. 750 kg
Power requirements Three-phase 200 V 50/60 Hz, 20 A

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