Stress Analysis Products

X-ray diffraction (XRD) is a powerful technique used in materials science and engineering to analyze the internal stresses within crystalline materials. X-ray diffraction patterns provide information about the crystal structure and, crucially for stress analysis, the spacing between atomic planes. When a material is subjected to stress, the interatomic distances change, altering the diffraction pattern. By analyzing these changes, such as shifts in peak positions or broadening of peaks, researchers can quantify the stress within the material and its distribution, aiding in the design and optimization of engineering components subjected to mechanical loads.


Application notes

Explore the example analyses to see which analytical technique is right for you.

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