X-ray Topography Products

X-ray topography is a specialized technique utilized in materials science to visualize crystal defects, such as dislocations and grain boundaries, within crystalline materials. By directing X-rays onto a sample, the crystal structure causes the X-rays to be absorbed, diffracted, or transmitted in distinct patterns depending on the orientation and quality of the crystal lattice. These patterns reveal detailed information about the internal structure of the material, including defects. X-ray topography is particularly valuable for studying defects that influence material properties and performance, aiding in the development of advanced materials and understanding the behavior of semiconductor devices, among other applications.