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Semiconductor Metrology Tools
X-ray metrology solutions from lab to fab
Crystallography
X-ray and electron diffraction for crystallography​
X-ray Diffraction & Scattering
X-ray diffractometers for crystalline materials analysis​
XRF Spectrometers
X-ray fluorescence spectrometers for elemental analysis​
Imaging & Non-destructive Testing
Computed tomography and radiography systems for X-ray imaging​
Thermal Analysis
Thermal and evolved gas analysis instruments for materials characterization​
Handheld Raman
Handheld Raman spectrometers for materials identification​
Components
X-ray generators, detectors, optics, and other components​
Process Control
In-line monitoring systems​
Semiconductor Metrology Tools
X-ray metrology solutions from lab to fab
WDXRF
Flexible elemental analysis for thin films
XRR, EDXRF & Optical
X-ray and hybrid metrology solutions for blanket and patterned wafers
TXRF
Wafer surface contamination metrology
HRXRD
X-ray metrology for epitaxial films
XRT
Non-destructive dislocation imaging
XRD
X-ray diffraction for crystallographic orientation of wafers and ingots
CDSAXS
X-ray critical dimension metrology
Crystallography
X-ray and electron diffractometers and consumables for crystallography
X-ray Diffraction
X-ray diffractometers for protein and small molecule crystallography​
Electron Diffraction
Electron diffractometer for protein and small molecule crystallography​
Reagents
Formulations and other consumables for protein crystallization​
X-ray Diffraction & Scattering
X-ray diffraction and scattering analyses for atomic level materials characterization
XRD
X-ray diffractometers for polycrystalline materials characterization ​
SAXS
Small angle X-ray scattering for nanoscale size, shape, and morphology analyses​
Stress Analysis
X-ray diffractometers for non-destructive residual stress analysis​
XRF Spectrometers
X-ray fluorescence spectrometers for elemental analysis
EDXRF
Energy dispersive X-ray fluorescence spectrometers for elemental analysis ​
WDXRF
Wavelength dispersive X-ray fluorescence spectrometers for elemental analysis ​
TXRF
Total reflection X-ray fluorescence spectrometers surface and trace phase analysis​
Imaging & Non-destructive Testing​
Non-destructive imaging analysis by X-rays
X-ray Computed Tomography
Research grade industrial X-ray computed tomography for non-destructive 3D imaging​
NDT Products
Radiography instruments for non-destructive testing​
Molecular Imaging
Multimodal molecular imaging systems for pre-clinical studies​
All Industries
Overview of all industries we serve​
Nanotechnology & Materials Sciences
Atomic, nano- to micron-scale materials structure analyses​
Semiconductor & Electronic Devices
Metrology tools from lab to fab
Biotechnology & Life Sciences
Atomic, nano- to micron-scale organic materials characterization​
Environment & Energy
Mineralogical and elemental analyses for industrial and environmental needs​
Construction
Mineralogical and elemental analysis for construction materials​
Safety & Security
Tools for chemical threat identification and forensics ​
Academic Research
Analytical instruments for teaching and synchrotron beamline components
Nanotechnology & Materials Sciences
Atomic, nano- to micron-scale materials structure analyses
Materials Science Research
Crystalline structure, nanoscale morphology, and elemental analyses for materials science​
Nanotechnology
Atomic to nanoscale materials characterization for nanotechnology research​
Advanced & New Materials
State-of-the-art analysis techniques developed for advanced and new materials research​
Chemistry
A wide range of analysis tools for solutions to study liquids, powders, solids, films, or single crystals ​
Coatings & Thin films
Elemental, crystallographic, and structural characterization tools for coatings and thin films ​
Metals & Alloys
Elemental, crystalline phase, and texture analysis for metals and alloys ​
Polymers, Plastics
Analysis tools for additive concentration, percent crystallinity calculation, and advanced materials characterization​
Composites
High-resolution 3D imaging for characterization of fillers, fibers, pores, and cracks in composites​
Ceramics
Crystalline phase and elemental analyses for ceramics characterization
Biotechnology & Life Sciences
Atomic, nano- to micron-scale organic materials characterization
Pharmaceuticals
Crystalline structure and elemental analyses from drug discovery to process control​
Life Science Researches
Protein and small molecule crystallography and various imaging instruments for life science research​
Biotechnology
Crystalline structure, nanoscale structure, and elemental analyses for engineered biological materials​
Food & Food Ingredients
Elemental analysis and foreign object screening for food and food ingredients safety​
Cosmetics
Crystalline structure and elemental analyses for R&D, QC, and materials identification for anti-counterfeit prevention​
Environment & Energy
Mineralogical and elemental analyses for industrial and environmental needs
Batteries
Crystalline structure characterization of electrode for R&D and non-destructive imaging for failure analysis
Mining & Refining
Elemental and mineralogical analyses for every stage of R&D and process control
Environment & Pollution
Heavy metal analysis for contamination monitoring and recycling materials classification​
Geology & Minerals
Mineralogical and elemental analysis for in-depth study of geological specimens, and natural and artificial minerals​
Petroleum & Petrochemicals
Mineralogical and elemental analysis for exploration, production, and distribution process
Photovoltaics
Crystalline and elemental analyses for thin-film photovoltaic materials
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Rigaku Oxford Diffraction Forum
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Semiconductor Metrology Tools
Crystallography
X-ray Diffraction & Scattering
XRF Spectrometers
Imaging & Non-destructive Testing
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Nanotechnology & Materials Sciences
Semiconductor & Electronic Devices
Biotechnology & Life Sciences
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Construction
Safety & Security
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