CT Lab HR160

Uncompromising high-resolution CT, now within reach for every lab

High-end CT scanners often include specialized measurement techniques and complex configurations that increase both cost and operational complexity. CT Lab HR160 focuses on the capabilities that matter most for practical research and engineering: 160 kV X-ray versatility, true 250 nm spatial resolution, a 62 nm minimum voxel size, and a straightforward workflow.

Its lens-free cone-beam geometry allows the field of view and resolution to be adjusted simply by changing the source-to-object distance and source-to-detector distance. No source, detector, or lens changes are required. This streamlined architecture makes it easier to move between samples and imaging requirements while minimizing setup time and hardware reconfiguration.

See both the big picture and the fine details

CT Lab HR160 combines a flexible field of view with true submicron imaging. The field of view ranges from 0.18 mm in diameter × 0.14 mm tall to 103 mm in diameter × 81 mm tall per scan. This flexibility allows users to inspect larger structures and then focus on small regions of interest for detailed analysis.

For example, an entire RAM stick can be scanned before zooming in to investigate micron-scale solder-joint defects, wire connections, buried circuits, connectors, and integrated-circuit layer integrity. Because the sample remains intact, internal structures can be studied without physical cross-sectioning.

One streamlined CT workflow

CT imaging requires scan-condition optimization, projection-image collection, reconstruction, and review of the resulting 3D volume. CT Lab HR160 simplifies this process with a one-flow-bar software interface that guides users through scan configuration and acquisition.

Reconstruction can be performed automatically, and reconstructed volumes can be loaded directly into CT Viewer for immediate review. The simplified workflow reduces trial and error, helps new users become productive more quickly, and lets experienced users move faster from sample setup to results.

Broad materials and application versatility

The combination of 40–160 kV operation, a 16.6 W nanofocus transmission X-ray source, flexible cone-beam geometry, and submicron imaging supports samples ranging from organic materials to electronic components.

Batteries

Visualize pores, cracks, and material inhomogeneity within and between battery electrode particles. Three-dimensional imaging can distinguish interparticle and intraparticle defects and help researchers investigate how manufacturing quality and cycling-induced degradation affect mechanical stability, capacity retention, reliability, and battery lifetime.

Electronics

Inspect printed circuit boards and small electronic components non-destructively. CT Lab HR160 can reveal solder-joint voids, broken or thinning connections, electrode layers, cracks, buried circuits, and dimensional variations while preserving the device for further testing.

Submicron imaging also supports detailed examination of multilayer ceramic capacitors and inductors, including electrode thickness and spacing, void distribution, thinning, and discontinuities that may affect electrical performance and reliability.

Advanced materials

Reveal voids, cracks, porosity, fiber orientation, delamination, adhesive bonds, weak interfaces, and other internal features in composites, resins, polymers, and molded materials. Non-destructive three-dimensional inspection helps connect processing conditions and microstructure with strength, reliability, damage, and long-term performance.

Additive manufacturing

Visualize and quantify cracks and pores in additively manufactured parts, including micropores within feedstock powders. The resulting data can help distinguish defects introduced during fabrication from those inherited from the feedstock and support process optimization, quality assurance, and failure analysis.

Medical devices and pharmaceuticals

Study the internal structure, function, and failure mechanisms of devices such as stents and implants without destroying the sample. Submicron X-ray CT can also reveal coatings, pores, internal defects, and other fine structures in pharmaceutical tablets and particles.