Nanotechnology and Material Sciences
X-ray analyses for atomic to nano-scale perspective
Owing to its short wavelength, X‑rays are the optimal probe to study atomic to nanoscale structures. X‑ray diffraction (XRD) and scattering instruments and technologies play an essential role in these areas. We also provide X‑ray fluorescence (XRF) spectrometers for elemental analysis, X‑ray computed tomography (CT) for non-destructive imaging, and thermal analysis instruments for thermodynamic studies. Rigaku's easy-to-use analytical instruments can uncomplicate all of these material analyses so you can focus on your tasks.
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Select your area of research or industry and explore more.
Material science research
XRF, XRD, and X-ray scattering techniques enable detailed analysis of elemental composition, crystalline phases, layer thickness, and molecular structure in diverse fields like biology, chemistry, physics, and engineering.
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Nanotechnology
XRD can measure atomic distances in diverse nanostructures, while small angle X-ray scattering (SAXS) provides information about nano-scale structures and morphologies. Both techniques play a crucial role in nanotechnology materials research.
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Advanced & new materials
New materials research often pushes the limit of conventional analysis techniques, requiring studying extremely thin films or imaging individual dislocations across a 12-inch wafer. We have been partnering with industry leaders for decades to develop new techniques to meet these needs.
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Chemistry
We provide comprehensive XRF, XRD, SAXS, X-ray imaging, thermal analysis, and Raman spectroscopy solutions to study liquids, powders, solids, films, or single crystals. These tools are all easy to use and support both academic and industrial research.
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Coatings and thin films
Coatings and thin films require optimized analysis techniques. We provide XRF and XRR for thickness and composition determination and XRD for crystallographic orientation and texture analyses. These tools are widely used from process control to academic research.
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Metals and alloys
Strength and integrity are often critical qualities of metal parts, and they can be studied and controlled by using various analysis techniques, including XRF for elemental composition, XRD for crystalline phase and orientation, and X-ray CT for voids and cracks.
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Polymers and plastics
Polymers and plastics have different aspects that need to be studied for research and process control. XRF identifies additive concentrations, adhering to RoHS/WEEE regulations. XRD identifies polymorphous and calculates percent crystallinity. SAXS explores nanoscale periodic structures, and X-ray CT reveals pores and fillers.
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Composites
Composites are a combination of two or more materials, and how each element is distributed influences the material's characteristics. High-resolution X-ray CT is a powerful technique that can image the size, shape, and distribution of fibers and fillers in composites.
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Ceramics
XRD is one of the most commonly used techniques to study crystalline phase composition and structures, which can significantly affect ceramics' characteristics. XRF is also used for elemental analysis.
Learn more >Related products
Many products contribute to the nanotechnology and materials science fields. Use the Product Finder to find the best match for your needs.
SmartLab
Advanced, state-of-the-art, high-resolution XRD system powered by Guidance expert system software
Learn moreZSX Primus IV𝒾
High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software
Learn moreXtaLAB Synergy-ED
A new and fully integrated electron diffractometer for measuring submicron crystals, utilizing a seamless workflow from data collection to structure determination of crystal structures.
Learn moreMiniFlex
Sixth-generation general purpose benchtop XRD system for phase ID and phase quantification
Learn moreSupermini200
Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders
Learn moreXRTmicron (Lab)
XRT (X-ray topography) imaging system for emerging power electronics, optoelectronics, and 5G / 6G communications (SiC, GaN, GaAs, InP, Ga₂O₃) for up to 300 mm wafers
Learn moreDSCvesta2
DSC with industry-first self-diagnostic feature and industry's highest temperature range
Learn moreApplication notes
Explore the example analyses to see which analytical technique is right for you.
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XRT1539 - Co, Br, Mn in TPA and PTA
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XRT1336 - Gold Processing
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XRF1131 - Standardless FP Analysis of Lithium-ion Battery Cathode Material LiFePO₄ by ZSX Primus IV
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XRD2001 - Orientation and Residual Stress Evaluation in Metal Thin Films
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XRD1014 - Ab-initio Crystal Structure Determination of a Cu-MOF Using Powder Diffraction Data Obtained from a Benchtop X-ray Diffractometer
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XCT2101 - Textile and Fiber Industry using the nano3DX
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WDXRF1126 - Accurate Quantitative Analysis of Ferrosilicon by the Fusion Method using ZSX Primus III NEXT
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WDXRF1123 - Quantitative Analysis of Stainless Steel using the ZSX Primus III NEXT
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WDXRF1121 - Quantitative Analysis of Cast Iron using ZSX Primus III NEXT
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WDXRF1120 - Quantitative Analysis of Low Alloy Steel using the ZSX Primus III NEXT
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WDXRF1100 - Fused Bead Analysis for Wide Concentration Ranges of Various Oxide Materials using OXIDE-FB-PAK
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WDXRF1098 - Fe, Ni and Co Alloy Analysis by the Fundamental Parameter Method using the Simultix 15
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WDXRF1096 - Fe, Ni and Co Based Alloy Analysis by Fundamental Parameter Method using ZSX Primus III+
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WDXRF1094 - Quality and Process Control of Natural and Processed Iron Ores by the Pressed Powder Method on Simultix 15
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WDXRF1092 - Fixed Angle Measurement using the Semi-Quantitative Analysis Function SQX of ZSX Guidance Software
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WDXRF1091 - Beryllium Analysis in Beryllium Copper Alloy using ZSX Primus IV with RX85
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WDXRF1088 - Boron Analysis in Glass Powder
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WDXRF1062 - Quantitative Analysis of Soda-lime Glass
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WDXRF1055 - Quantitative Analysis of Aluminum Alloy on Supermini200
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WDXRF1052 - Accurate Determination for Elements in Laterite Ores by Pressed Powder Method
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WDXRF1042 - Quantitative Analysis of Low Alloy Steel using the Supermini200
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WDXRF1026 - Accurate Quantitative Analysis of Ferrosilicon by the Fusion Method
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WDXRF1025 - Quantitative Analysis of Blast Furnace Slag by the Pressed Powder Method
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WDXRF1024 - Quantitative Analysis of Blast Furnace Slag by Fusion Method
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WDXRF1023 - Pt, Rh and Pd Analysis of Used Automobile Catalyst by WDXRF
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WDXRF1021 - Quantitative Analysis of Stainless Steel
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WDXRF1017 - Quantitative Analysis of Cast Iron
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WDXRF1009 - Quantitative Analysis of Low Alloy Steel
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WDXRF1002 - Analysis of Iron Ores by Oressed Powder Method
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TA6022 - Thermal Decomposition and Combustion of Polyetheretherketone (PEEK)
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TA6018 - Thermal Decomposition of Polyolefins
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TA6016 - Thermal Decomposition of Polyvinyl Resins
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TA6012 - Evaluation Amount of Water in Flour, Drug and Polymer
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TA6011 - Determination of Compounding Ratio for Complex Material, Nylon
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TA6009 - TG-MS Analysis for Debinding Process of Ceramics
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TA6008 - Characterizing the Thermal Degradation of Polymer
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TA6007 - Rapid Discrimination of Thermal Decomposition Analysis for Nylons
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TA6003 - Evolved Gas Analysis of PEFC
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TA6002 - Evolved Gas Analysis for Volatile Organic Compounds
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TA6001 - Characterizing Thermal Analysis for Polymer Product
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TA5014 - Expansion of Powder Material, Polymethyl­methacrylate (PMMA)
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TA5013 - Softening Measurement of Coated Steel
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TA5010 - Simulation of Sintering Condition for Ceramics
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TA5008 - Water Absorption and Dehydration of Organic Compound α-cyclodextrin
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TA5007 - Thermal Desorption of Aromatic Compound in Metallic Complex
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TA5005 - Fusion of Polyethylene
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TA5004 - Thermal Decomposition of Polyester in Water-vapor Atmosphere
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TA-Pyrolisis - Characterization of Pyrolysis of Polymers by TG-MS
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SMX042 - In situ crystallization and diffraction experiments with the Insight Chips liquid nano-channel holder and XtaLAB Synergy-ED
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SMX041 - Observing a Temperature-induced Phase Transition of Cu(ta)₂, a MOF, with XtaLAB Synergy-ED
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SMX039 - The Absolute Structure of Light-atom-containing Molecules
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SMX038 - Rigaku Rotating Anodes: Powerful and Reliable Sources for Seamless and High-throughput Small Molecule Structure Solution
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SMX037 - Identification of a Fungicide Degradant using the XtaLAB Synergy-ED
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SMX036 - Comparison of Two XtaLAB Synergy Instruments
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SMX034 - The Molecular Grabber Method: Another Crystalline Sponge using Protein
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SMX033 - XtaLAB Synergy-ED: A True Electron Diffractometer
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SMX032 - PDF Analysis of Glassy Materials on a Home Laboratory Diffractometer
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SMX030 - Application of the Crystalline Sponge Method for Structure Determination of Persistent organic Pollutants of Agrochemical Degradation Products
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SMX029 - What Is This? and Data Collection on Metal-organic Framework Microcrystals using the XtaLAB Synergy-S
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SMX028 - Calibrating the XtaLAB Synergy-S for PDF Analysis
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SMX027 - Micro Powder Diffraction on XtaLAB Synergy Single Crystal Diffractometers
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SMX024 - Charge-density Data Collection on XtaLAB Synergy Diffractometers
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SMX023 - Charge-density Data Collection on XtaLAB Synergy-S with HyPix 6000
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SMX019 - The HyPix-6000HE Detector and Its Ability to Resolve Reflections at Close Crystal-to-Detector Distances
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SMX018 - Structures in Seconds with What Is This?
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SMX017 - Determining Structure of Volatile Compounds with the Crystalline Sponge Method
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SMX011 - Superior Data Quality Achieved with the XtaLAB Synergy-i, Microfocus Mo source
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SMX010 - A Study of the Stereochemistry of Sucrose and a Phenidate Derivative using the Copper Microfocus Source of the XtaLAB Synergy-i
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SMX006 - Treatment of Modulated Structures in CrysAlisᴾʳᵒ
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SMX004 - Using CrysAlisᴾʳᵒ to Elucidate Twinned Crystals by X-ray Diffraction
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RACCT9048 - 3D Printed Superalloy
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RACCT9027 - Aluminum Part Dimensional Analysis by X-ray CT
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RACCT9026 - Aluminum Die Casting Void Analysis by X-ray CT
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RACCT9006 - Superabsorbent Water Absorption Process Observation by X-ray CT
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RACCT9005 - Shoe Sole Compression and Pore Size Analysis by X-ray CT
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RACCT9004 - Particleboard Packing Density Analysis by X-ray CT
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RACCT9003 - Makeup Sponge Wear and Tear Analysis by X-ray CT
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RACCT9002 - Insulator Porosity and Cell Wall Thickness Analysis by X-ray CT
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RACCT9001 - Earplug Pore Size Analysis by X-ray CT
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RACCT9000 - CFRP Void and Fiber Analysis by X-ray CT
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EDXRF3269 - NEX QC II - Silicone Coat Weight on Paper and Plastic
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EDXRF3197 - NEX QC+ QuantEZ - Additives in Polymers
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EDXRF3150 - NEX QC+ QuantEZ—Analysis of Black Mass for Lithium Battery Recycling
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EDXRF3144 - NEX CG II - Analysis of Lube Oils by ASTM D7751
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EDXRF1994 - Material Identification
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EDXRF1990 - NEX QC—Plating Baths
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EDXRF1978 - NEX DE Series—Analysis of Alloy Powders for Metal 3D Printing
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EDXRF1933 - NEX DE Series—Catalysts Residue and Heavy Metal Screening in Pharma Formulation Process Chemistry
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EDXRF1904 - NEX QC+—Chromium on HDG Steel
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EDXRF1884 - Alloy Powders for 3D Printing
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EDXRF1853 - Analysis of Fiberglass
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EDXRF1846 - NEX DE—Analysis of Carbon Black
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EDXRF1834 - NEX QC+—Titanium on Steel
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EDXRF1812 - NEX QC+—Phosphorus on Steel
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EDXRF1720 - NEX DE VS—Electroless Nickel Plating
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EDXRF1693 - NEX DE Series—Ni:Fe Metallurgy
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EDXRF1631 - NEX QC+—Zirconium on Aluminum
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EDXRF1630 - NEX QC—Zirconium on Aluminum
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EDXRF1620 - NEX QC—Titanium on Aluminum
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EDXRF1619 - NEX QC+—Titanium on Aluminum
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EDXRF1606 - NEX QC+—Chromium on Aluminum
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EDXRF1605 - NEX QC—Chromium on Aluminum
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EDXRF1595 - NEX QC+ QuantEZ—Metals & Alloys
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EDXRF1559 - NEX QC+—Low Silicone Coating on Plastic
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EDXRF1550 - NEX DE VS—Lead-free Solder
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EDXRF1537 - NEX DE—Gold Processing
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EDXRF1422 - NEX QC+—Silicone Coating on Paper and Plastic
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EDXRF1343 - NEX QC+—Electric Arc Furnace Slag
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EDXRF1187 - NEX QC—Ti & Fe in Kaolin Clay
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EDXRF1140 - NEX QC—Silicone Coating on Paper and Plastic
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EDXRF1033 - Chlorine and RoHS Elements in Polyethylene
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EDXRF1023 - Analysis of PVC Resins
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B-XRI1035 - Ceramic Additive Manufacturing
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B-XRI1034 - 3D Printed Titanium Rods
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B-XRI1033 - Respirator Cartridge
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B-XRI1024 - Fiber orientation analysis of short fibers in GFRPs by micro X-ray CT
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B-XRI1016 - Observation and Analysis of Laminated Films by Micro X-ray CT
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B-XRI1007 - Visualization of Components in Ceramic Composites using a High-resolution 3D X-ray Microscope
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B-XRI1004 - Visualization and Size Analysis of Foreign Matter in CFRP using a High-resolution 3D X-ray Microscope
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B-XRD3007 - Tri-axial Stress Analysis of a Multilayer Ceramic Capacitor (MLCC)
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B-XRD2039 - Observation of Anisotropic and Nonlinear Thermal Expansion of Thin Films on Substrates by In-Plane X-ray Diffraction
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B-XRD2037 - Evaluation of Native Oxide Film on Larger-diameter Silicon Substrates Using High-precision Thin Film XRD for Advanced Research
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B-XRD2032 - Observation of Orientation State of Polypropylene Film Products by 2D-GIWAXS Measurement
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B-XRD1170 - Phase Identification of a Black Foreign Material on a Sintered BaTiO₃ Ceramic using Micro-area X-ray Diffraction
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B-XRD1169 - Temperature-dependent Analysis of Polymer Crystallization Behavior Using High-speed Time-resolved Measurement
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B-XRD1162 - In-situ Evaluation of Orientation in Polymer Films at Different Draw Ratios by Wide Angle X-ray Scattering
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B-XRD1149 - Evaluation of Barium Titanate Polymorphs by Rietveld Analysis
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B-XRD1143 - Verifying the Validity of Crystallite Sizes Determined by the FP Method
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B-XRD1139 - Calculation of Molecular Stacking Spacing of Copper Phthalocyanine using PDF Analysis
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B-XRD1136 - Structural Characterization of Zeolite by Electron Density Analysis
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B-XRD1132 - Quantitative Analysis of Glass with the DD Method
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B-XRD1131 - Structural Characterization of Zeolite by PDF Analysis
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B-XRD1119 - Quantitative Characterization of Polymer film by Orientation Function
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B-XRD1118 - Quick Pole Figure Measurement of a Metal Material using 2DD
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B-XRD1117 - Observation of a Phase Transition at High Temperature under Various Atmospheres
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B-XRD1115 - Quantitative Analysis of γ-Al₂O₃ by the DD Method
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B-XRD1112 - Structural Analysis of Amorphous Silica by PDF Analysis
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B-XRD1110 - Particle Size Distribution Analysis of Ferroelectric Nanopowder by USAXS
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B-XRD1109 - Structure Determination of Ferroelectric Nano-powder by PDF Analysis
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B-XRD1105 - High-speed in-situ Measurement of Melting Process of Metal
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B-XRD1104 - Evaluation of Grain Condition and Orientation of Cemented carbide using 2D XRD
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B-XRD1102 - Particle Size / Distribution of Pigment Ink by USAXS
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B-XRD1072 - Crystallite Size Analysis Analysis of a Microvolume of Metallic Nanoparticles with a Benchtop X-ray Diffractometer
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B-XRD1071 - Crystallite Size Analysis of a Catalyst Material by the Scherrer Method
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B-XRD1063 - Measurement of a Film Sample
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B-XRD1060 - MiniFlex Measurement of Trace Samples
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B-XRD1044 - Crystal Phase Identification of Carbide Tips by Micro-area 2D X-ray Diffraction
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B-XRD1030 - Particle Diameter Distribution of Gold Nanoparticles
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B-XRD1018 - Crystallite Size Distribution of Zinc Oxide Nanoparticles
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B-XRD1014 - Crystal Orientation Analysis of Rolled Sheet Material by Pole Figure Measurement
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B-TA2042 - Thermal Stability of Polyethylene Glycol Studied by TG-MS
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B-TA2039 - Evaluation of Biomass Plastics by TG-FTIR
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B-TA2032 - Qualitative Analysis of Biopolymer in Humidity Atmosphere by HUM-STA-MS
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B-TA2028 - Thermal Decomposition of Nitrile Gloves by Sample Observation STA-MS
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B-TA2027 - Evolved Gas Analysis of Polyacetal
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B-TA2019 - TG-MS Analysis of Apatite-1
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B-TA2007 - TG-MS of Tobacco: Part 2
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B-TA2006 - TG-MS of Tobacco: Part 1
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B-TA1093 - DSC Evaluation of the Effect of Outdoor Exposure on the Glass Transition Temperature of Natural Rubber
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B-TA1092 - Effect of Curing Time on Epoxy Adhesive Bond Strength Evaluated by TMA
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B-TA1088 - Expansion and Shrinkage of Fibers under Load Variation; Effect of Degradation
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B-TA1087 - Expansion and Shrinkage of Fibers Induced by Humidity Changes
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B-TA1085 - Analysis of Amorphous PMMA -Sample Observation STA, ChromTA (Chromatic Thermal Analysis)
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B-TA1083 - Color Change Induced by Surface Oxidation of Stainless steel Sample Observation STA; ChromTA
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B-TA1082 - Analysis of amorphous PET -Sample Observation STA, ChromTA (Chromatic Thermal Analysis)
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B-TA1081 - TG‑DTA Evaluation of Epoxy Resin Using Sample Observation Function
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B-TA1074 - Load-dependent expansion and shrinkage of fibers
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B-TA1073 - Combustion Behavior of Fibers: Natural and Synthetic Fibers
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B-TA1072 - Moisture Absorption of Fibers: Mass Changes Induced by Humidity Variations
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B-TA1070 - Thermal History Of Electrical Wire Insulating Sheath Polymer
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B-TA1068 - TMA Measurement of Heat-Shrink Tubing
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B-TA1055 - Change in the glass transition temperature due to the degradation of fluoroelastomer
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B-TA1054 - Expansion and Shrinkage of Polyimide Films Due to Changes in Humidity
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B-TA1053 - Expansion of Polymer Films : Differences Due to Humidity
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B-TA1048 - Crystallization of LLDPE
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B-TA1047 - Curing of Epoxy Adhesives by DSC
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B-TA1046 - DSC measurement for crystallinity of HDPE
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B-TA1039 - Measurement of glass transition of PMMA by dynamic DSC
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B-TA1036 - Thermal Behavior of Paraffin Wax by Sample Observation DSC
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B-TA1031 - CTA Evaluation of Thin Al Sheet by TMA Tensile Loading Method
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B-TA1030 - Thermal Decomposition of Starch-based Filler by Sample Observation STA
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B-TA1029 - Thermal Behavior of Calcium Sulfate Dihydrate by STA
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B-TA1028 - Thermal Behavior of Biodegradable Plastic Straw by STA
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B-TA1026 - Thermal Analysis of PCB by TMA
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B-TA1024 - Evaluation of O-ring by Low-temperature TMA
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B-TA1023 - Shape Deformation of Glass Powders
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B-TA1015 - Oxidative Decomposition of HDPE
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B-TA1014 - DSC Measurement of Binary Alloys
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B-TA1012 - Measurement of Different Yarn Materials by STA
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B-TA1010 - Thermal Behavior of Caffeine by STA and DSC
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B-TA1008 - Mechanochemical Effect in Caffeine
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B-TA1007 - DSC Measurement of Friction Ballpoint Pen
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B-TA1006 - Microplastics (MP) Characterization by TG-DSC
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B-TA1004 - Softening of Coating Material by TMA
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B-TA1003 - The Behavior of Water Absorption and Dehydration of Organic Materials
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B-SCX1011 - High-Speed Measurement Of A Peptide Drug Using HyPix-Arc 150°
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