The characteristics of various devices composed of nanometer-scale thin films is affected by film structure parameters such as film thickness and density. X-ray reflectivity (XRR) is a method for analyzing film thickness, density and surface or interface roughness of single- or multi-layer thin films nondestructively. It can be applied to not only crystalline materials but also to amorphous substances and materials opaque under visible light.
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Compact X-ray diffractometer for quality control of materials that is easy to use and is ideal for routine work
Windows®-based software suite for Rigaku's X-ray diffractometers
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods