Organic semiconductors are the most promising materials among next-generation semiconductors because of the low production cost and outstanding characteristics that can never be achieved by the conventional inorganic materials. The orientation and arrangement of the molecule are crucial to the physical properties of organic semiconductors. This article demonstrates the advantage of the in-plane X-ray diffraction method for evaluating the orientation condition of a copper phthalocyanine (CuPc) thin film, a photoconductive and electroluminescent organic material.
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