Organic semiconductors are the most promising materials among next-generation semiconductors because of the low production cost and outstanding characteristics that can never be achieved by the conventional inorganic materials. The orientation and arrangement of the molecule are crucial to the physical properties of organic semiconductors. This article demonstrates the advantage of the in-plane X-ray diffraction method for evaluating the orientation condition of a copper phthalocyanine (CuPc) thin film, a photoconductive and electroluminescent organic material.
XRD products from Rigaku
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Compact X-ray diffractometer for quality control of materials that is easy to use and is ideal for routine work
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers