Properties of cement, such as curing time and strength, depend on the clinker components. Optical microscopy and X-ray diffraction analysis are used as quantitative analysis methods of clinker components (crystalline phases). In particular, quantitative analysis using X-ray diffraction combined with Rietveld refinement is widely used in cement research and quality control as a quick and easy method. Precise and accurate analyses are required to evaluate correct cement characterization. Also, high-speed measurements are required since free lime and other components may change depending on the environment. We evaluated the quantification accuracy and precision of Rietveld refinement by performing tenfold iterative measurements with the MiniFlex benchtop X-ray diffractometer equipped with the D/teX Ultra2 high-speed 1D X-ray detector. One measurement took approximately five minutes. The NIST clinker standard reference material (NIST2688) was used for the measurement.
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