In powder X-ray diffractometry, the weight fraction (content) of amorphous materials is obtained using the peak separation method or the Rietveld method. However, the solution from the peak separation method has large errors in some cases, and the Rietveld refinement requires adding a standard sample to the measurement sample. The Direct Derivation (DD) method developed by Rigaku is able to directly calculate the amorphous content from single-phase and mixed-phase measurement data. The following is an analysis example using the DD method, in which the contents of a mixture containing glass powder and two different types of crystal powder were calculated.
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