Rigaku logo

News & Press Releases

Stay informed.

Explore our updates on new technology developments, where we share insights into new analytical solutions that empower new perspectives in various research areas. Check out the updates on our research collaborations, highlighting our synergistic efforts with our customers and partners. Lastly, don't miss out on our corporate updates, sharing organizational milestones and vision for the future.

news and press releases 450x450

News

  Product line Release date
Introduction of Our Sustainability Activities Page May 15, 2024
Sponsorship of "Japan Physics Society Jr. Session" and Rigaku Prize Award May 13, 2024
Paper using data from Rigaku's XtaLAB Synergy-ED published in prestigious journal Science Electron Diffraction Feb 21, 2024

Press Releases

  Product line Release date
Rigaku Announces New Tagline ~Powering New Perspectives~ Sep 14, 2022
Jeff Li Named New CEO of Rigaku Beijing Corporation Aug 31, 2022
Kent Heath Named New CEO of Rigaku Americas Holding Inc. and President of Rigaku Americas Aug 2, 2022
Rigaku’s Analysis of the Asteroid Ryugu by WDXRF and Thermal Analysis will be Invaluable for Future Research Projects Thermal Analysis, WDXRF Jun 9, 2022
Access Rigaku’s Electron Diffraction Technology without the Capital Outlay Single Crystal May 23, 2022
Rigaku Pharma Forum 2022 for Advanced Analytical Solutions used in Industry and Research Single Crystal Apr 3, 2022
C-Therm Partners with Rigaku in Support of New Thermal Analysis Product Line in US Thermal Analysis Mar 8, 2022
First Crystallographic Structures Determined using Rigaku’s Recently Launched Electron Diffractometer Published in Nature Communications Single Crystal Feb 8, 2022
Rigaku’s New MiniFlex XpC, Ideally Suited for Routine Quality Control Operations XRD Nov 7, 2021
Dr. Markus Kuhn Appointed Fellow of the Rigaku Semiconductor Metrology Division Semiconductors Oct 11, 2021
Newly Developed, Unique XRT Tool To Revolutionize Semiconductor Material Defect Characterization Techniques Semiconductors, X-ray Topography (XRT) Aug 2, 2021