AutoMATE II

    Micro-Area X-ray Residual Stress Measurement System

    Highly accurate micro-area residual stress with both iso- and side-inclination methods

    Residual stress may be created during the manufacturing process of a material, or it may accumulate in a structure over many years in operation. In either case, this stress can have a serious negative effect on a product's quality, durability and lifetime. Accurate detection of residual stress is an important element of the quality control process and helps predict the service lifetime of products.

    AutoMATE II Overview

    Residual stress may be created during the manufacturing process of a material, or it may accumulate in a structure over many years in operation. In either case, this stress can have a serious negative effect on a product's quality, durability and lifetime. Accurate detection of residual stress is an important element of the quality control process and helps predict the service lifetime of products.

    X-ray diffraction (XRD) for stress analysis of large/heavy samples

    In the past, if you wanted to make highly accurate residual stress measurements, you had to use an R&D diffractometer because of the accuracy of the goniometer. However, this restricts the weight and size of the samples you can measure. On the other hand, dedicated laboratory and factory-floor residual stress analyzers suffer from reduced accuracy due to the nature of their mechanical designs, while, in their favor, they have the flexibility of measuring large and heavy parts.

    World's most advanced residual stress measurement system

    Large and heavy samples are measured by AutoMATE II with high accuracy by utilizing a 2-axis goniometer with a stationary sample stage. The working volume for a sample is 720 mm (W) × 560 mm (D) × 540 mm (H) and the maximum sample weight is 30 kg. An optional sample stage can hold 20 kg and is equipped with an automatic XYZ stage with X, Y translations of -50 ≤ X, Y ≤ 50 mm and a Z translation of -5 ≤ Z ≤ 35 mm. The working volume for a sample with the automated XYZ stage is 720 mm (W) × 560 mm (D) × 335 mm (H). Some testing devices, including a 4-point bending device, can be attached to the sample stage. The X-ray source and detector arm are mounted on a highly accurate two-axis goniometer that can position them relative to the measurement site and perform scans with minimum steps of 0.1 microns when using the automated XYZ stage.

    Advanced D/teX Ultra 1000 silicon strip detector technology

    The most advanced new feature of the AutoMATE II lies in an innovative new X-ray detector. The detector used in the AutoMATE II is the D/teX Ultra1000, an electronic Si strip detector that has high dynamic range, high sensitivity, and good energy resolution, as well as not requiring any consumable gas.

    AutoMATE II Features

    Highly accurate goniometer allows for true micro-area residual stress measurement
    Automatic mapping measurements with teaching function
    Large and heavy samples are measured with high accuracy
    An X-ray radiation enclosure with interlock system automatically locks the enclosure door when the X-ray shutter is open
    The measurement position is adjusted by a CCD camera equipped with a microscope having a zoom function
    The two-axis goniometer system allows for both iso-inclination and side-inclination methods automatically without readjustment of the sample position

    AutoMATE II Videos

    AutoMATE II Specifications

    Technique X-ray diffraction (XRD)
    Benefit Residual stress measurement on large and/or heavy objects by XRD
    Technology Specialty 2-axis X-ray diffractometer with mapping capability
    Attributes 3 kW sealed X-ray tube
    D/teX Ultra 1000 silicon strip detector
    Options Automated XYZ stage
    CCD microscope with zoom function
    Computer External PC, MS Windows OS, AutoMATE II for Windows
    Dimensions 1200 (W) x 1910 (H) x 1320 (D) mm
    Mass Approx. 1060 kg (core unit)
    Power requirements 3Ø, 200 VAC 50/60 Hz, 20 A,  69 kW

    AutoMATE II Application Notes

    The following application notes are relevant to this product

    AutoMATE II Resources

    Rigaku Journal articles

    adobeX-ray analysis of a magnesium alloy expected to be a useful lightweight material Read the Article

    Contact Us

    Whether you're interested in getting a quote, want a demo, need technical support, or simply have a question, we're here to help.