| Course Name: | Basic Training Course for SmartLab | |
| Duration: | 5-days | |
| Sessions: | 15-19 March, 2021 12-16 July, 2021 04-08 October, 2021 |
|
| Course Times: | 9 a.m. – 4 p.m. | |
| Location: | Online |
General Scope
This course addresses the basic operations in terms of hardware and software for the SmartLab multi-purpose XRD instrument. The training is based on hands-on solving of example problems in order to illustrate a range of XRD techniques. Starting from basic general purpose powder X-ray diffraction right through to pole figure, residual stress, SAXS and thin-film X-ray diffraction including X-ray reflectivity, grazing incidence diffraction, in-plane diffraction and high-resolution diffraction using PDXL, 3D Explore and Global Fit software. Previous experience in X-ray diffraction is required. Persons attending the training should expect to leave the course with a basic working knowledge of both the SmartLab hardware and analysis software. Some of the specific topics covered are outlined below.
Rigaku will provide the training notes and a course certificate.
Persons attending the training are advised to have a personal computer with SmartLab Studio II software installed and software dongle / network license that is required to run the software.
E-mail with the details and online training link will be sent to registered attendees prior to the training.
Operators, engineers, research scientists and university students in university and operators of the SmartLab diffractometer supplied by Rigaku
Registration is required. The number of places is limited.
Course Agenda
| Day 1 | |
| 9:00 - 12:00 | Theory |
| 1. Introduction | |
| 2. XRD basics | |
| 3. Sample preparation | |
| SmartLab (SL) hardware (HW) and software (SW) | |
| 4. Measurements | |
| 13:00 - 16:00 | SW |
| 1. Introduction to SLSII | |
| 2. Data analysis | |
| a) Basic/data processing | |
| b) Conversion/saving | |
| c) Visualization/graphics | |
| d) Database (COD, ICDD) installation | |
| 3. Qualitative | |
| a) RIR | |
| b) Internal/external standards | |
| 4. Introduction to the Rietveld Method, WPPF | |
| 5. WPPF - exercises | |
| Day 2 | |
| 9:00 – 12:00 | SW |
| 1. Quantitative phase analysis | |
| 2. Quantification of amorphous phases | |
| 3. Comprehensive analysis | |
| a) Crystallite size determination | |
| 4. Crystallite size distribution | |
| 13:00 – 16:00 | SW |
| 1. Crystal structure solution from powder X-ray data | |
| a) Indexing, space group determination | |
| b) Crystal structure model determination | |
| SL HW & SW | |
| 2. Transmission measurements | |
| 3. PDF | |
| Day 3 | |
| 9:00 - 12:00 | Theory |
| 1. Gracing Incidence Diffraction (GID) | |
| 2. In-plane diffraction | |
| 3. Pole Figure | |
| SL HW and SW | |
| 4. GID measurement | |
| 5. In-plane measurement | |
| 13:00 - 16:00 | SL HW and SW |
| 1. PF measurements (0D,2D) measurement & analysis | |
| Theory, HW & SF | |
| 2. Residual Stress | |
| 3. Residual Stress measurement (0D,2D) & analysis | |
| Day 4 | |
| 9:00 - 12:00 | Theory, HW & SW |
| 1.0D SAXS/WAXS | |
| 2. USAXS | |
| 3. 2D SAXS/WAXS | |
| 13:00 - 16:00 | SL HW & SW |
| 1. 2D GISAXS | |
| 2. Microdiffraction (incident optics, camera) | |
| 3. In-situ measurements | |
| Day 5 | |
| 9:00 – 12:00 | Theory, HW & SF |
| 1. XRR theory, measurement and analysis | |
| 2. RC measurement and analysis | |
| 13:00 - 16:00 | SL HW & SW |
| 1. RSM measurement and analysis (fast RSM, wide-RSM) | |
| 2. Q & A Session | |
| 3. Summary of the training | |
| 4. Q & A Session | |
| 5. Summary of the training | |
Note: During training course, the latest version of software for instrument control and analysis software that is available on the market is used. Therefore, details of the operation might be different from your environment. Our trainers are available to discuss the operations on your version of the software. In such a case, you are advised to bring your personal computer with software installation and software dongles along with you.
Please, note, our application scientists are available for discussions or demonstrations of other Rigaku products, e.g. SMX XRD systems or XRF spectrometers, therefore please let us know in advance to schedule these appointments in case of interest.