Testimonial: CEA-Leti

Our experience with the Rigaku SmartLab

At CEA-Leti, in the heart of Grenoble’s deep-tech ecosystem, our mission is to advance micro- and nanotechnologies. Within our Platform for Nanocharacterization (PFNC), we provide state-of-the-art tools to support both research and industry partners.

We chose the Rigaku SmartLab X-ray diffractometer in 2014 because it offered what our researchers need most: versatility and performance. The high-brilliance rotating anode source, 1D and 2D detectors, and in-plane diffraction mode make it ideal for thin film and semiconductor applications. Just as importantly, the intuitive software allows fast, accurate measurements for new users while still offering advanced options for experts.

The SmartLab has become indispensable—supporting routine characterizations as well as breakthroughs. One highlight was our work on Phase Change Random Access Memory (PCRAM) materials. Using SmartLab, we developed a new XRD methodology that revealed the link between nanoscale strain and macroscale stress in GST thin films, published in the Journal of Applied Physics (2020)¹.

For us, SmartLab is more than an instrument—it is a cornerstone of our X-ray platform, enabling collaboration, innovation, and discovery. We strongly recommend it to any institution seeking a versatile and powerful XRD system.

The reference of the work is given below¹ and illustrations of the published results acquired on the Rigaku SmartLab system are shown here:

¹F. Fillot, C Sabbione, Nanoscale mechanics of thermally crystallized GST thin film by in situ x-ray diffraction, J. Appl. Phys. 128, 235107, 2020 : https://doi.org/10.1063/5.0023653