What is Mapping Analysis?

Mapping analysis is a method that visually represents data relationships and patterns, helping to intuitively understand structures and features. To analyze the distribution of elements and crystal structures in samples, X-ray fluorescence (XRF) analysis and X-ray diffraction (XRD) are used.

Mapping analysis using X-ray fluorescence

XRF mapping scans different points on a sample's surface and analyzes the wavelengths (energies) of the emitted fluorescence X-rays. This visualizes the distribution of elements within the sample, which is useful for analyzing metal and mineral components, trace elements in food and pharmaceuticals, and detecting impurities or foreign substances. XRF mapping is valuable for quality control and research and development.

Mapping analysis using X-ray diffraction

XRD mapping measures different points on a sample and analyzes the X-ray diffraction patterns obtained. This visualizes the distribution of peak widths and intensities, aiding in evaluating crystallinity and orientation, and detecting foreign substances.

Combining XRF and XRD

Combining XRF and XRD allows for more detailed mapping analysis. XRF provides elemental distribution while XRD offers information on crystal structures and phases, giving a comprehensive understanding of the material. This combination is useful for developing new materials, identifying foreign substances, and quality control.

Mapping analysis is a powerful method for visualizing the distribution of material components and structures, with XRF and XRD playing crucial roles. These techniques are essential in modern analytical fields, providing high precision and reliability for quality control and research in various samples such as electronic materials, food, pharmaceuticals, minerals, and metals.