Chemical / Composition Identification

Commonly employed techniques to non-destructively determine the composition of an unknown sample are X-ray fluorescence (XRF) , X-ray diffraction (XRD) and Raman spectroscopy.

X-ray fluorescence provides elemental composition information for boron (B) through uranium (U) from parts-per-million (PPM) to percent (%) levels. Using fundamental parameters (FP) algorithms, XRF can provide quantitative analysis without the need for reference standards.

X-ray diffraction provides phase composition identification and can distinguish the major, minor, and trace compounds present in a sample. XRD analysis includes the mineral name of the substance, chemical formula, crystalline system, and reference pattern number from the ICDD International database. Standardless quantitative information can also be obtained from XRD using Rietveld Analysis.

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Application notes

The following application notes are relevant to this technique

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