Volume 42(1) - Winter 2026

This study investigates microbially produced polyesters (polyhydroxyalkanoates, PHAs) derived from renewable resources. Drawn porous fibers were fabricated from P(3HB)-based copolymers with enhanced flexibility and processability, and their microstructures were systematically characterized. Synchrotron X-ray scattering and high-resolution 3D X-ray microscopy were employed to assess changes in higher-order structural features, including crystalline orientation, lamellar morphology, and porosity. The results indicate that fiber stretchability originates from reversible structural rearrangements. To explore potential medical applications, the ligation performance of the porous fibers was also evaluated. The fibers exhibited excellent handling characteristics, including self-ligation and the formation of smaller ligation sites, supporting their potential use as surgical sutures.

A method for estimating profiles of individual components (basis profile decomposition) from powder X-ray diffraction profiles of mixtures is described. In addition, a method for quantitative analysis combining the estimated profiles with the DD method is introduced. We show that it is possible to accurately estimate profiles of individual components by selecting the method according to the measured profiles or sample characteristics.

As the demand for environmental sustainability and energy conservation continues to grow, lightweight structural design has become increasingly important in transportation systems such as automobiles. Engineering plastics are being adopted as alternatives to steel because of their advantageous mechanical properties. However, residual stress introduced during molding can adversely affect structural stability, making quantitative evaluation essential. This study investigates the applicability of X-ray diffraction for evaluating residual stresses in polyacetal.

Total scattering measurement is widely used to evaluate the local structure of the cathode and the solid electrolyte for Li-ion batteries. The observed pair distribution function G_obs(r) obtained from the Fourier transform of the structure factor S(Q) has information not only about neighboring distances but also about the coordination numbers and the number density of sample. Herein, we discuss deviations in G_obs(r) arising from the standard deviation of S(Q) and the termination error of the measurable maximum and minimum scattering vector in G_obs(r) using the basic theory of total scattering analysis.

The TFXRD X-ray diffraction system for thin films was developed in response to the need for measuring large-diameter wafers in their original state. TFXRD is equipped with a high-precision goniometer specialized for thin-film evaluation and a large XY stage designed to accommodate large-diameter wafers. These features enable highly accurate evaluation of advanced materials by X-ray diffraction. Models equipped with an automatic wafer handling robot have also been added to the lineup, enabling automated continuous measurements of multiple wafers. In this article, we present the configuration of the TFXRD system, which is specifically designed for thin-film materials evaluation.

In recent years, as electronic devices have become smaller, electronic components have become increasingly miniaturized and highly integrated. In electronic components such as multilayer ceramic capacitors (MLCCs), the evaluation area for X-ray diffraction has been reduced to several tens of micrometers. To meet these needs, the microarea X-ray diffractometer DicifferX Microarea Edition was developed. This apparatus can form a point beam of approximately ϕ20 μm (full width at half maximum of the direct beam) at the sample position by using a collimator with a minimum diameter of ϕ10 μm. In addition, this diffractometer is equipped with a high-intensity X-ray source, a high-precision goniometer, and a two-dimensional detector. These features enable high-precision, high-speed and high-intensity measurements of microareas as small as several tens of micrometers in the laboratory. In this article, we introduce an example in which the cross-section of a zinc-plated nut was measured at 20 μm intervals and qualitatively analyzed.

A simultaneous thermal analyzer (STA) is an instrument that can simultaneously perform multiple thermal analyses to obtain multifaceted knowledge about the sample to be measured. The long-awaited new STA model, STAvesta, differs from its predecessor STA8122 in its ability to perform simultaneous TG and DSC measurements. We would like to introduce STAvesta, a next-generation STA, which features innovative design, significantly enhanced sensitivity and separation resolution, and improved operability.