ZSX Primus III NEXT
Tube-Above Sequential Wavelength Dispersive X-ray Fluorescence Spectrometer for Industrial Applications
Elemental analysis of solid samples
Rigaku ZSX Primus III NEXT delivers rapid elemental industrial quality control by quantitative determination of major and minor elements from Be through Cm for powder and solid samples.
This new scanning wavelength dispersive X-ray fluorescence spectrometer features Rigaku’s unique X-ray tube-above configuration and is built upon the succesful ZSX Primus series platform.
ZSX Primus III NEXT Overview
Geared for industrial applications
The ZSX Primus III NEXT is an ideal tool for any industrial application, requiring elemental analysis, such as
∘ Minerals and Mining∘ Metals
∘ Cement
∘ Ceramics and Refractories
∘ Glass Manufacturing
∘ Petrochemicals
∘ Chemicals
∘ Environment
Turnkey application packages
Industry-specific application packages are available. The "Pre-Calibration Package," which stores calibration curves at the time of shipment, the "Calibration Package," which includes standard samples and analysis conditions, and the "Master Matching Library" for standardless analysis (SQX) which is specialized for certain types of products, are available to help users start up the analysis operations.
Easy application sharing
The ZSX Primus III NEXT, ZSX Primus IV, and ZSX Primus IVi share the same hardware and software platform, making it easy to share applications between spectrometers.
Improved quality of analytical results
Have confidence in each analysis result. Measurement statistics and spectrometer physical parameters can be displayed with each analysis result to easily spot irregularities.
ZSX Primus III NEXT—your ideal partner for fast and reliable production control in highly demanding industrial environments.
ZSX Primus III NEXT Features
ZSX Primus III NEXT Specifications
| Analytical range | ₈O - ₉₆Cm standard (₄Be - ₉₆Cm Optional - depending on crystal configurations) | |
|---|---|---|
| Spectral method | Wavelength dispersive X-ray fluorescence | |
| Atmosphere | Vacuum | |
| X-ray tube | End window type Rh target 3 kW | |
| Irradiation method | Tube-above | |
| Sample changer | Expandable sample changer with up to 48 positions | |
| Sample inlet | Air lock system | |
| Maximum sample size | φ 52 mm × 30 mm (H) | |
| Primary filter | Ni400, Ni40, Al125, Al25 | |
| Primary Soller slit | 3 positions automatic exchange machanism Standard and fine slits Optional: Ultralight element slit |
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| Analyzing crystal | Standard: LiF, 200, PET, RX26 | |
| Pulse height analyzer | Digital multichannel analyzer (DMCA) | |
| Detector | SC (Scintillation counter) F-PC (Gas flow proportional counter) Optional: S-PC LE (Gas sealed proportional counter: does not require P-10 gas) |
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| Power requirements | Instrument: Single (200 - 240 V), three phase (200 V) 50/60 Hz 40A Personal computer: 1-phase, 100-240 V, 10A |
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ZSX Primus III NEXT Application Notes
ZSX Primus III NEXT Resources
Webinars
| Analysis of Hazardous Heavy Elements in Soil and Sediment | Watch the Recording |
| A Non-Destructive XRF Technique for Rapid and Easy Screening of Residual Catalysts in APIs and Intermediates | Watch the Recording |
| Quality control of API potency, excipient blend uniformity, and heavy metals impurities by non-destructive and direct analysis of intact pills by XRF | Watch the Recording |
Rigaku Journal articles
 Wavelength Dispersive X-ray fluorescence Spectrometer - ZSX Primus III NEXT |
Read the Article |
| How to measure trace amounts of sample by X-ray fluorescence analysis |
Read the Article |
| Thickness and composition analysis of thin film samples using FP method by XRF analysis |
Read the Article |
| Sample preparation for X-ray fluorescence analysis V. / Fusion bead method—part 2: practical applications |
Read the Article |
| Sample preparation for X-ray fluorescence analysis IV./ Fusion bead method―part 1 basic principals |
Read the Article |
| Sequential benchtop WDXRF spectrometer Supermini200 |
Read the Article |
ZSX Primus III NEXT Events
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