Quantitative Analysis with XRF: Mining Applications

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This is a written summary of a live webinar presented on August 17, 2026. The recording and resources are available on the recording page.

Presented by:

Carmen HS

Carmen Kaiser-Brügmann

XRF Application Scientist

Rigaku

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Webinar summary

In this webinar, Carmen discusses how X-ray fluorescence (XRF) is widely used for elemental analysis in mining and geochemical applications, supporting activities ranging from exploration and grade control to mineral processing and quality assurance.

Different types of XRF instrumentation serve different analytical needs. Handheld and energy dispersive XRF (EDXRF) systems are useful for rapid screening and field analysis, while wavelength dispersive XRF (WDXRF) provides higher resolution, sensitivity, precision, and accuracy for laboratory analysis. XRF complements techniques such as X-ray diffraction (XRD), which provides information about mineral structure.

Pressed powder preparation is commonly used for mining samples because it provides a relatively simple approach to routine analysis. However, analytical performance depends strongly on sample preparation. Moisture, particle size, sample homogeneity, pellet density and thickness, surface condition, and contamination from grinding equipment can all affect measured X-ray intensities. Samples should be dried appropriately, crushed, pulverized, split to obtain a representative portion, and finely milled. A typical target is for at least 95% of the final material to pass a 45 µm sieve. The powder is then mixed with a binder and pressed into a mechanically stable pellet with a flat, smooth analytical surface.

Accurate quantitative analysis also requires suitable calibration standards covering the appropriate concentration range, with standards prepared in the same manner as unknown samples. Mining samples present significant matrix effects because multiple elements coexist within complex mineral matrices. Absorption and enhancement effects can distort the relationship between X-ray intensity and concentration, requiring mathematical corrections. These can include theoretical alpha corrections, internal-standard ratio methods, and corrections based on Compton scattering.

An internal-standard approach can compensate for matrix effects by adding a constant amount of another element and ratioing its intensity against that of the analyte. For iron ore, for example, cobalt can serve as an internal standard, with the ratio of Fe Kβ to Co Kα used for correction. Monitoring the cobalt intensity can also provide a check on the consistency of the grinding process.

Compton scattering provides another ratio-based approach. Quant Scatter FP combines scattering information with theoretical fundamental-parameter corrections to compensate for matrix effects, including particle-size effects that theoretical alpha corrections alone cannot address. Examples involving iron ore, copper ore and concentrates, and nickel sulfide ore and concentrates demonstrate improved calibration fits and agreement with certified reference values when these correction methods are combined. The scattering approach is primarily applicable to heavier elements, generally from titanium onward, rather than lighter elements such as silicon.

Fundamental parameters (FP) calibration can also address materials with substantially different matrices. Unlike empirical calibration, which generally requires matrix-matched standards, FP calibration uses calculated theoretical intensities together with measured intensities. An application involving different marl compositions showed that multiple matrices could be incorporated into a single calibration and that pressed-powder results were generally close to reference results obtained using fused beads. A limitation is that the elemental composition must be sufficiently well characterized to account for essentially 100% of the sample.

Reliable XRF analysis ultimately depends on the entire analytical process rather than the spectrometer alone. Robust and consistent sample preparation, sufficient calibration standards, appropriate analytical ranges, effective matrix corrections, method validation, drift correction, and continuing assessment are all important. Proficiency-testing programs can provide an additional means of benchmarking laboratory performance and identifying opportunities to improve analytical quality.

Frequently asked questions

XRF can sequentially or simultaneously analyze many elements over a wide concentration range, from parts-per-million levels to percentage concentrations. It is well suited to the complex matrices encountered in ores, concentrates, industrial minerals, and related geological materials. It can also be used at different stages of the mining process, from rapid field screening to high-precision laboratory analysis and automated high-throughput testing.

EDXRF instrumentation is generally more compact and has a simpler hardware design, making it suitable for rapid screening and field-oriented applications. WDXRF systems provide higher resolution and sensitivity and are better suited to high-precision, accurate quantitative analysis. Handheld XRF can provide an initial indication of elemental composition, EDXRF can support higher sample throughput, and WDXRF can then be used when greater analytical accuracy and precision are required.

Particle size, moisture, density, thickness, homogeneity, pressing conditions, and the quality of the analytical surface can all influence X-ray intensity. Coarse particles can produce lower intensities, while inconsistent density or an uneven surface can reduce reproducibility. Samples therefore need to be dried, appropriately crushed and pulverized, representatively split, finely milled, mixed with binder, and pressed into stable pellets with smooth analytical surfaces. Contamination introduced by grinding vessels and media must also be considered.

A useful initial target is for at least 95% of the sample to pass through a 45 µm sieve after final milling. The optimum fitness can be evaluated experimentally by monitoring XRF Intensity. Coarse material produces lower intensity, while sufficiently fine material eventually reaches a region where further particle-size reduction produces little additional increase. A particle-size analyzer or screening sieves can also be used to assess fineness.

Ores and concentrates contain numerous coexisting elements that interact with the fluorescent X-rays generated during analysis. One element can absorb radiation from another or enhance its measured intensity, causing the relationship between concentration and measured intensity to deviate from a simple calibration curve. Matrix corrections compensate for these absorption and enhancement effects and can substantially improve quantitative accuracy.

Quant Scatter FP combines information from the Compton scattering line with theoretical fundamental-parameter corrections. The scattering measurement helps compensate for matrix-related effects, including particle-size effects, while theoretical alpha corrections address absorption and enhancement caused by coexisting elements. Combining the two can provide better calibration fits and closer agreement with certified reference values than either theoretical alpha correction or an internal-standard method alone. The scattering correction is most appropriate for heavier elements, generally from titanium onward.

Empirical calibrations generally require standards that closely match the matrix of the unknown samples, which can require separate calibrations for substantially different materials. Fundamental-parameters calibration incorporates theoretical intensities and matrix corrections, allowing different matrices to be combined within a single calibration. This can be particularly useful for materials such as marl, where silica, alumina, carbonate content, and loss on ignition may vary considerably. The method requires sufficiently complete knowledge of the sample composition.

A robust method requires consistent sample preparation, enough calibration standards to cover the required analytical range, and appropriate matrix corrections. The method should be continually assessed to ensure that it remains suitable for the unknown samples being analyzed. Drift corrections maintain the calibration method for changes in the intensity. Check samples monitor instrument performance.

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