Low-Cost Energy Dispersive X‑ray Fluorescence (EDXRF) Analyzer

    Elemental analysis of solids, liquids, powders, alloys and thin films

    As a premium low cost benchtop energy dispersive X-ray fluorescence (EDXRF) elemental analyzer, the Rigaku NEX QC delivers wide elemental coverage with an easy-to-learn software interface in a robust package designed for industrial at-line quality control applications. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids, slurries and thin films.

    NEX QC Overview

    EDXRF optimized for quality control applications

    Specifically designed for routine quality control elemental analysis applications, the new Rigaku NEX QC features an intuitive "icon-driven" touch screen interface for easy operation and a built-in printer for convenience.

    EDXRF with broad elemental coverage

    The shuttered 50 kV X-ray tube and Peltier cooled semiconductor detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD).

    NEX QC options: autosampler and helium purge options

    Options include automatic sample changer, sample spinner and helium purge for enhanced light element sensitivity. For those applications requiring higher resolution and sensitivity, Rigaku offers the NEX QC+ energy dispersive X-ray fluorescence analyser which is equipped with a silicon drift detector (SDD).

    NEX QC Features

    Non-destructive elemental analysis for sodium (Na) to uranium (U)
    Affordable EDXRF for routine measurements and basic QC purposes
    Solids, liquids, alloys, powders and thin films
    Lightweight, small footprint, and does not require an external PC
    Icon-driven touchscreen interface and built-in printer
    50 kV X-ray tube for wide elemental coverage
    High-performance Si-PIN diode detector
    Multiple automated tube filters for enhanced sensitivity
    See Specifications for options

    NEX QC Videos

    NEX QC Specifications

    Technique Direct excitation energy dispersive X-ray fluorescence (EDXRF)
    Benefit Affordable EDXRF; elemental analysis of solids, liquids, powders, alloys, and thin films
    Technology EDXRF using a high-performance Si-PIN diode detector
    Attributes 50 kV 4 W X-ray tube, high-performance Si-PIN diode detector, embedded computer, icon-driven graphical user interface, built-in printer, USB and Ethernet connections, analyze Na to U
    Options Helium purge, automatic sample changes, single-position sample spinner, UPS, portable carrying case
    Dimensions 31 (W) x 376 (H) x 432 (D) mm
    Mass Approx. 16 kg
    Power requirements 1Ø, 100 – 240 V, 1.4 A (50/60 Hz)

    NEX QC Application Notes

    The following application notes are relevant to this product

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