NEX QC II Series

EDXRF for Everyday Quality Control  

Fast, non-destructive elemental testing made simple

The NEX QC II Series simplifies routine quality control and elemental testing. These compact benchtop EDXRF analyzers deliver fast results for solids, liquids, powders, and thin films—ideal for everyday quality control in labs, plants, and production environments. Designed for ease of use, the NEX QC II and NEX QC II+ feature intuitive operation with an embedded computer and built-in printer, so your team can get results quickly with no specialized technical background required. The first-generation NEX QC+ QuantEZ remains available for users who require expanded method development, advanced calibration strategies, and optional compliance features, including 21 CFR Part 11 support.  

800x610 NEX QC II Series (left)_picture_2026.02.26 800x610 NEX QC II Series_picture_2026.02.26 NEX QC+ QuantEZ workstation

NEX QC II Series Overview

Trusted technology, next-generation performance

The NEX QC II Series is a second-generation line of energy dispersive X-ray fluorescence (EDXRF) analyzers built on the proven NEX QC platform. Designed specifically for industrial quality control, the systems deliver fast, non-destructive elemental analysis with no technical background required.

Its compact, fanless design protects internal components in harsh environments, and the embedded computer and built-in printer eliminate the need for PCs on the plant floor. The clear, icon-driven touchscreen interface guides you through setup to results, minimizing training time and reducing operator error.

This new design incorporates graphene window silicon drift detectors, refined optics, upgraded electronics, improved detector protection, and a redesigned touchscreen interface. These enhancements support fast, reliable measurements with minimal training and make the system easy to use across production floors, manufacturing lines, and laboratory settings. Compared to the original NEX QC models, NEX QC II instruments offer improved measurement performance, better light-element sensitivity, and a more intuitive interface.

The series includes two models, the NEX QC II and NEX QC II+, to accommodate different performance needs and budgets. The first-generation NEX QC+ QuantEZ is available for users who need the advanced capabilities of the QuantEZ platform.

 


 

Simple, fast quality control testing

Model: NEX QC II

The NEX QC II provides multi-element testing across a wide range of materials, making it an excellent fit for daily QC tasks, incoming and outgoing material checks, and at-line verification.

Designed for simple operation, the NEX QC II features an embedded computer and a clear, icon-driven touchscreen interface that guides users through setup and measurement. Most operators can begin running samples with only a brief introduction. Its compact, fanless design fits easily into tight spaces, and the built-in printer offers fast, on-demand reporting at the instrument.

Product highlights:
  • Compact, space-saving design, no external computer required
  • Intuitive touchscreen interface for ease of training and operation
  • Reliable general-purpose performance for routine QC applications
  • Built-in printer for immediate reporting
  • Optional carrying case for portability


 

Enhanced performance, same simplicity

Model: NEX QC II+

The NEX QC II+ is the higher-performance model in the new generation, offering enhanced sensitivity for light elements and improved spectral resolution. Its upgraded SDD allows QC teams to meet tighter specifications and handle more demanding applications with confidence. It is ideal for facilities that need increased throughput or light-element performance without adding operational complexity.

Product highlights:
  • Higher-resolution graphene window SDD for improved sensitivity
  • Ideal for more demanding QC environments requiring tighter specs
  • Enhanced light-element performance
  • Same simple, intuitive touchscreen operation as NEX QC II


 

Expanded capabilities and compliance options

Model: NEX QC+ QuantEZ

The NEX QC+ QuantEZ remains available as a software-driven model for users who require the advanced capabilities of the QuantEZ platform. Unlike the embedded touchscreen systems in the NEX QC II Series, the first-generation QuantEZ model operates from an external PC, supporting more flexible method development and calibration strategies.

This model is well-suited for laboratories or regulated environments that need additional features such as RPF-SQX Fundamental Parameters software, or optional compliance tools like SureDI for 21 CFR Part 11 support.

Product highlights:
  • PC-based QuantEZ software for advanced capabilities
  • Supports RPF-SQX Fundamental Parameters software
  • SureDI option available for FDA 21 CFR Part 11 compliance


 

Which model is best?

The right instrument depends on your specific analytical requirements, the nature of your samples, and the operating environment. If you are unsure which model aligns with your application, please contact us. Our team can help identify the best fit for your materials, performance goals, and operational needs.

NEX QC II Series Features

Rapid, non-destructive elemental analysis
Multi-element capabilities, from ppm to percent levels
Measurement of all elements from sodium (Na) to uranium (U)
Multi-application versatility, including solids, liquids, alloys, powders, and thin films
50 kV X-ray tube for wide elemental coverage
High-performance silicon drift detectors
Multiple automated tube filters for enhanced sensitivity
Easy-to-use software with multilingual user interface
Compact, space-saving design
Easy sample preparation and no complex setups
Low cost of ownership, self-installed and maintained
Various options, including autosampler and carrying case

NEX QC II Series Specifications

Technique Direct excitation energy dispersive X-ray fluorescence (EDXRF)
Benefit Excellent value EDXRF systems offering an unmatched balance of quality, affordability, and performance
Technology EDXRF using a high-performance, large-area graphene window silicon drift detector (NEX QC II and NEX QC II+)

EDXRF using a high-performance silicon drift detector (NEX QC+ QuantEZ)
Attributes 50 kV 4 W X-ray tube, high-performance silicon drift detectors, embedded computer, icon-driven graphical user interface, built-in printer, USB and Ethernet connections, analyze Na to U
Options Helium purge, automatic sample changers, single-position sample spinner, UPS, portable carrying case
Dimensions 287 (W) x 465 (H) x 262 (D) mm (NEX QC II and NEX QC II+)

331 (W) x 232 (H) x 432 (D) mm (NEX QC+ QuantEZ)
Mass Approx. 15.5 kg (NEX QC II and NEX QC II+)

Approx. 16 kg (NEX QC+ QuantEZ)
Power requirements 1Ø, 100 – 240 V, 1.15 A (50/60 Hz) (NEX QC II and NEX QC II+)

1Ø, 100 – 240 V, 1.4 A (50/60 Hz) (NEX QC+ QuantEZ)
Warranty 2 years

NEX QC II Series Events

Learn more about our products at these events

  • Pittcon 2026
    March 9 2026 - March 11 2026
    San Antonio, TX, USA
  • AWA Global Release Liner Summit
    March 11 2026 - March 13 2026
    Amsterdam, Netherlands
  • Analytica
    March 24 2026 - March 27 2026
    Munich, Germany
  • STLE Annual Meeting & Exhibition
    May 17 2026 - May 21 2026
    New Orleans, LA, USA
  • Labelexpo Americas 2026
    September 15 2026 - September 17 2026
    Chicago, IL
  • Gulf Coast Conference (GCC) 2026
    October 13 2026 - October 15 2026
    Galveston, TX, USA

NEX QC II Series Training

Upcoming training sessions

  • EDXRF Operator Training (USA)
    March 23 2026 - March 24 2026
    Please contact info@RigakuEDXRF.com
    Cedar Park, Texas
    Get hands-on training for NEX benchtop analyzers. Through direct experience, you will gain knowledge and skills in instrument calibration, method development, easy sample preparation techniques, and software operation.
  • EDXRF Operator Training (USA)
    May 4 2026 - May 5 2026
    Please contact info@RigakuEDXRF.com
    Cedar Park, Texas
    Get hands-on training for NEX benchtop analyzers. Through direct experience, you will gain knowledge and skills in instrument calibration, method development, easy sample preparation techniques, and software operation.
  • EDXRF Operator Training (USA)
    July 13 2026 - July 14 2026
    Please contact info@RigakuEDXRF.com
    Cedar Park, Texas
    Get hands-on training for NEX benchtop analyzers. Through direct experience, you will gain knowledge and skills in instrument calibration, method development, easy sample preparation techniques, and software operation.
  • EDXRF Operator Training (USA)
    September 14 2026 - September 15 2026
    Please contact info@RigakuEDXRF.com
    Cedar Park, Texas
    Get hands-on training for NEX benchtop analyzers. Through direct experience, you will gain knowledge and skills in instrument calibration, method development, easy sample preparation techniques, and software operation.
  • EDXRF Operator Training (USA)
    November 9 2026 - November 10 2026
    Please contact info@RigakuEDXRF.com
    Cedar Park, Texas
    Get hands-on training for NEX benchtop analyzers. Through direct experience, you will gain knowledge and skills in instrument calibration, method development, easy sample preparation techniques, and software operation.

Contact Us

Whether you're interested in getting a quote, want a demo, need technical support, or simply have a question, we're here to help.