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NEX QC+

High-Resolution Energy Dispersive X‑ray Fluorescence (EDXRF) Analyzer

Elemental analysis of solids, liquids, powders, alloys and thin films

For more demanding applications, or for situations where analysis time or sample throughput is critical, Rigaku offers the new NEX QC+ spectrometer. Employing the next generation silicon detector technology, the enhanced NEX QC+ affords significant improvement in elemental peak resolution and counting statistics, resulting in superior calibrations and measurement precision for the most challenging measurements.

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NEX QC+ Overview

EDXRF for quality control applications

Specifically designed for routine quality control applications, the new Rigaku NEX QC+ features an intuitive "icon-driven" touch screen interface for easy operation and a built-in printer for convenience.

EDXRF with high precision and broad elemental coverage

The shuttered 50 kV X-ray tube and Peltier cooled semiconductor detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of applications versatility and low limits-of-detection (LOD).

EDXRF with autosampler and helium purge options

Options include automatic sample changer, sample spinner and helium purge for enhanced light element sensitivity.

NEX QC+ Features

Non-destructive elemental analysis for sodium (Na) to uranium (U)
Combines superior performance with affordability
Solids, liquids, alloys, powders and thin films
Lightweight, small footprint, and does not require an external PC
Icon-driven touchscreen interface and built-in printer
50 kV X-ray tube for wide elemental coverage
SDD for superior resolution and sensitivity
Multiple automated tube filters for enhanced sensitivity
See Specifications for options

NEX QC+ Videos

NEX QC+ Specifications

Technique Direct excitation energy dispersive X-ray fluorescence (EDXRF)
Benefit Combines performance and affordability; elemental analysis of solids, liquids, powders, alloys, and thin films
Technology EDXRF using a high-performance SDD
Attributes 50 kV 4 W X-ray tube, high-performance SDD, embedded computer, icon-driven graphical user interface, built-in printer, USB and Ethernet connections, analyze Na to U
Options Helium purge, automatic sample changer, single-position sample spinner, UPS, portable carrying case
Dimensions 331 (W) x 376 (H) x 432 (D) mm
Mass Approx. 16 kg
Power requirements 1Ø, 100 – 240 V, 1.4 A (50/60 Hz)
Warranty 2 years

NEX QC+ Application Notes

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