NEX QC II Series

EDXRF for Everyday Quality Control  

Fast, non-destructive elemental testing at your fingertips 

The NEX QC II Series is designed to make everyday elemental testing straightforward and dependable. These benchtop EDXRF instruments deliver rapid elemental analysis for solids, liquids, powders, and thin films, supporting routine quality control across labs, plants, and production environments. Built on proven technology and refined for modern QC, the NEX QC II Series offers simple operation, reliable results, and a compact footprint that fits easily into tight spaces. The lineup includes the NEX QC II and NEX QC II+ models. The NEX QC+ QuantEZ is offered separately to users who require QuantEZ software features, including expanded method-development capabilities and 21 CFR Part 11 support.  

800x610 NEX QC II Series (left)_picture_2026.02.26 800x610 NEX QC II Series_picture_2026.02.26 NEX QC+ QuantEZ workstation

NEX QC II Series Overview

Trusted technology, next-generation performance

The NEX QC II Series is a second-generation line of energy dispersive X-ray fluorescence (EDXRF) analyzers built on the proven NEX QC platform. Designed specifically for industrial quality control, the systems deliver fast, non-destructive elemental analysis with no technical background required.

Its compact, fanless design protects internal components in harsh environments, and the embedded computer and built-in printer eliminate the need for PCs on the plant floor. The clear, icon-driven touchscreen interface guides you through setup to results, minimizing training time and reducing operator error.

This new design incorporates graphene window silicon drift detectors, refined optics, upgraded electronics, improved detector protection, and a redesigned touchscreen interface. These enhancements support fast, reliable measurements with minimal training and make the system easy to use across production floors, manufacturing lines, and laboratory settings.

Compared to the original NEX QC models, NEX QC II instruments offer improved measurement performance, better light-element sensitivity, and a more intuitive interface.

The series includes two new models, the NEX QC II and NEX QC II+, to accommodate different performance needs and budgets. The NEX QC+ QuantEZ system, offered separately, continues to support users who rely on QuantEZ software features such as reduced dependence on standards and 21 CFR Part 11 support.


Everyday elemental analysis made simple

Model: NEX QC II

The NEX QC II provides routine multi-element testing across a wide range of materials, making it an excellent fit for daily QC tasks, incoming and outgoing material checks, and at-line verification.

Designed for simple operation, the NEX QC II features an embedded computer and a clear, icon-driven touchscreen interface that guides users through setup and measurement. Most operators can begin running samples with only a brief introduction. Its compact, fanless design fits easily into tight spaces and on-site testing locations, and the built-in printer offers fast, on-demand reporting at the instrument.

Product highlights:
  • Compact, space-saving design, no external computer required
  • Redesigned touchscreen interface for ease of training and operation
  • Reliable general-purpose performance for routine QC applications
  • Built-in printer for immediate reporting
  • Optional carrying case for portability


NEX QC II+ delivers higher performance and throughput

Model: NEX QC II+

The NEX QC II+ is the higher-performance model in the new generation, offering faster analysis times, enhanced light-element sensitivity, and improved spectral resolution. Its upgraded SDD allows QC teams to achieve tighter specifications, reduce measurement times, and handle more demanding applications with confidence. It is ideal for facilities that need increased throughput or higher sensitivity without adding operational complexity.

Product highlights:
  • Higher-resolution graphene window SDD for improved sensitivity
  • Ideal for more demanding QC environments requiring tighter specs
  • Enhanced light-element performance
  • Same simple, intuitive touchscreen operation as NEX QC II


NEX QC+ QuantEZ expands your analytical capabilities

Model: NEX QC+ QuantEZ

Take your elemental analysis to the next level with the NEX QC+ QuantEZ analyzer. This model offers a step up in performance and capabilities by adding powerful QuantEZ software.

Designed for users who need more than an entry-level system, the NEX QC+ QuantEZ runs from an external desktop or laptop computer. The core unit no longer features a touchscreen panel, but configurations are available with it for a hybrid experience.

NEX QC+ QuantEZ combines high-performance hardware with advanced software to simplify and streamline even the most complex workflows. This system transforms your experience with simple menu navigation and a customizable EZ Analysis screen. Unlike the base models, EZ Analysis uses an intuitive flow bar wizard for a step-by-step setup for creating your own methods. This simplifies method development to maximize your time and boost your productivity.

This model also expands your range of applications with the availability of RPF-SQX Fundamental Parameters. This software option reduces the need for standards, which can be expensive and hard to obtain. SureDI is also offered to support compliance with 21 CFR Part 11. This option allows those in regulated industries, like pharmaceuticals and cosmetics, to meet FDA requirements confidently.



Which model is best?

The best model depends on your specific analytical needs and the nature of your samples. We offer a comprehensive range of EDXRF spectrometers, from entry-level for basic screening to high-end models for challenging and complex applications. If you are not sure which instrument fits your needs, please feel free to  contact us. We can help you find the right solution.

NEX QC II Series Features

Rapid, non-destructive elemental analysis
Multi-element capabilities, from ppm to percent levels
Measurement of all elements from sodium (Na) to uranium (U)
Multi-application versatility, including solids, liquids, alloys, powders, and thin films
50 kV X-ray tube for wide elemental coverage
High-performance semiconductor detector
Multiple automated tube filters for enhanced sensitivity
Easy-to-use software with multilingual user interface
Compact, space-saving design
Easy sample preparation and no complex setups
Low cost of ownership, self-installed and maintained
Various options, including autosampler and carrying case
See Specifications for options

NEX QC II Series Specifications

Technique Direct excitation energy dispersive X-ray fluorescence (EDXRF)
Benefit Excellent value EDXRF systems offering an unmatched balance of quality, affordability, and performance
Technology EDXRF using a high-performance Si-PIN diode detector (NEX QC)

EDXRF using a high-performance silicon drift detector (NEX QC+ and NEX QC+ QuantEZ)
Attributes 50 kV 4 W X-ray tube, high-performance semiconductor detector, embedded computer, icon-driven graphical user interface, built-in printer, USB and Ethernet connections, analyze Na to U
Options Helium purge, automatic sample changers, single-position sample spinner, UPS, portable carrying case
Dimensions 331 (W) x 376 (H) x 432 (D) mm (NEX QC and NEX QC+)

331 (W) x 232 (H) x 432 (D) mm (NEX QC+ QuantEZ)
Mass Approx. 16 kg
Power requirements 1Ø, 100 – 240 V, 1.4 A (50/60 Hz)
Warranty 2 years

NEX QC II Series Events

Learn more about our products at these events

  • Pittcon 2026
    March 9 2026 - March 11 2026
    San Antonio, TX, USA
  • AWA Global Release Liner Summit
    March 11 2026 - March 13 2026
    Amsterdam, Netherlands
  • Analytica
    March 24 2026 - March 27 2026
    Munich, Germany
  • STLE Annual Meeting & Exhibition
    May 17 2026 - May 21 2026
    New Orleans, LA, USA
  • Labelexpo Americas 2026
    September 15 2026 - September 17 2026
    Chicago, IL
  • Gulf Coast Conference (GCC) 2026
    October 13 2026 - October 15 2026
    Galveston, TX, USA

NEX QC II Series Training

Upcoming training sessions

  • EDXRF Operator Training (USA)
    March 23 2026 - March 24 2026
    Please contact info@RigakuEDXRF.com
    Cedar Park, Texas
    Get hands-on training for NEX benchtop analyzers. Through direct experience, you will gain knowledge and skills in instrument calibration, method development, easy sample preparation techniques, and software operation.
  • EDXRF Operator Training (USA)
    May 4 2026 - May 5 2026
    Please contact info@RigakuEDXRF.com
    Cedar Park, Texas
    Get hands-on training for NEX benchtop analyzers. Through direct experience, you will gain knowledge and skills in instrument calibration, method development, easy sample preparation techniques, and software operation.
  • EDXRF Operator Training (USA)
    July 13 2026 - July 14 2026
    Please contact info@RigakuEDXRF.com
    Cedar Park, Texas
    Get hands-on training for NEX benchtop analyzers. Through direct experience, you will gain knowledge and skills in instrument calibration, method development, easy sample preparation techniques, and software operation.
  • EDXRF Operator Training (USA)
    September 14 2026 - September 15 2026
    Please contact info@RigakuEDXRF.com
    Cedar Park, Texas
    Get hands-on training for NEX benchtop analyzers. Through direct experience, you will gain knowledge and skills in instrument calibration, method development, easy sample preparation techniques, and software operation.
  • EDXRF Operator Training (USA)
    November 9 2026 - November 10 2026
    Please contact info@RigakuEDXRF.com
    Cedar Park, Texas
    Get hands-on training for NEX benchtop analyzers. Through direct experience, you will gain knowledge and skills in instrument calibration, method development, easy sample preparation techniques, and software operation.

Contact Us

Whether you're interested in getting a quote, want a demo, need technical support, or simply have a question, we're here to help.