NEX DE VS
Variable Spot Size Energy Dispersive X-ray Fluorescence (EDXRF) Spectrometer
For elemental analysis of solids, liquids, powders, alloys and thin films
A high-performance small (variable) spot benchtop EDXRF elemental analyzer, the new Rigaku NEX DE VS delivers wide elemental coverage with a easy-to-learn Windows®-based QuantEZ software. Small spot analysis, from sodium (Na) through uranium (U), of almost any matrix - from solids, thin films and alloys to powders, liquids, slurries and thin films.
NEX DE VS Overview
XRF elemental analysis in the field, plant or lab
Especially designed and engineered for heavy industrial use, whether on the plant floor or in remote field environments, the superior analytical power, flexibility and ease-of-use of the NEX DE adds to its broad appeal for an ever expanding range of applications, including exploration, research, bulk RoHS inspection, and education, as well as industrial and production monitoring applications. Whether the need is basic quality control (QC) or its more sophisticated variants — such as analytical quality control (AQC), quality assurance (QA) or statistical process control like Six Sigma — the NEX DE is the reliable high performance choice for routine elemental analysis by XRF.
XRF with 60 kV X-ray tube and SDD detector
The 60 kV X-ray tube and Peltier cooled silicon drift detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (60 kV), along with high emission current and multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD).
XRF options: autosampler, helium and standardless FP
Options include fundamental parameters, a variety of automatic sample changers, sample spinner, and helium purge for enhanced light element sensitivity.
NEX DE VS Features
NEX DE VS Videos
NEX DE VS Specifications
Technique | Direct excitation energy dispersive X-ray fluorescence (EDXRF) | |
---|---|---|
Benefit | Integrated camera and small spot analysis; analyze solids, liquids, powders, coatings, and thin films | |
Technology | Energy dispersive XRF (EDXRF) using a high-performance silicon drift detector (SDD) and integrated high-resolution camera | |
Attributes | 60 kV 12 W X-ray tube, high-performance SDD, analyze Na to U, precise positioning of samples to analyze 1 mm, 3 mm, and 10 mm spot sizes | |
Software | QuantEZ for control of spectrometer functions and data analysis | |
Options | Helium purge, automatic sample changers, single-position sample spinner, external PC with Microsoft® Windows® operating system, UPS, RPF-SQX Fundamental Parameters with Rigaku Scattering FP, SureDI support for 21 CFR Part 11 compliance, other software features | |
Dimensions | 356 (W) x 260 (H) x 351 (D) mm | |
Mass | Approx. 27 kg (core unit) | |
Power requirements | 1Ø, 100 – 240 V, 1.5 A (50/60 Hz) |
NEX DE VS Application Notes
NEX DE VS Events
Learn more about our products at these events
-
EventDatesLocationEvent website
-
-
There are no upcoming events
NEX DE VS Training
Upcoming training sessions
-
TitleDatesCostLocationNotesCourse outlineRegistration form
-
-
There are no upcoming training sessions
Contact Us
Whether you're interested in getting a quote, want a demo, need technical support, or simply have a question, we're here to help.