NEX DE VS

    Variable Spot Size Energy Dispersive X-ray Fluorescence (EDXRF) Spectrometer

    For elemental analysis of solids, liquids, powders, alloys and thin films

    A high-performance small (variable) spot benchtop EDXRF elemental analyzer, the new Rigaku NEX DE VS delivers wide elemental coverage with a easy-to-learn Windows®-based QuantEZ software. Small spot analysis, from sodium (Na) through uranium (U), of almost any matrix - from solids, thin films and alloys to powders, liquids, slurries and thin films.

    NEX DE VS Overview

    XRF elemental analysis in the field, plant or lab

    Especially designed and engineered for heavy industrial use, whether on the plant floor or in remote field environments, the superior analytical power, flexibility and ease-of-use of the NEX DE adds to its broad appeal for an ever expanding range of applications, including exploration, research, bulk RoHS inspection, and education, as well as industrial and production monitoring applications. Whether the need is basic quality control (QC) or its more sophisticated variants — such as analytical quality control (AQC), quality assurance (QA) or statistical process control like Six Sigma — the NEX DE is the reliable high performance choice for routine elemental analysis by XRF.

    XRF with 60 kV X-ray tube and SDD detector

    The 60 kV X-ray tube and Peltier cooled silicon drift detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (60 kV), along with high emission current and multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD).

    XRF options: autosampler, helium and standardless FP

    Options include fundamental parameters, a variety of automatic sample changers, sample spinner, and helium purge for enhanced light element sensitivity. 

    NEX DE VS Features

    Non-destructive elemental analysis for sodium (Na) to uranium (U)
    High-res camera and automated collimators for accurate sample positioning
    Solids, liquids, alloys, powders and thin films
    High-performance SDD for superior data
    Unmatched performance-to-price ratio
    Analyze 1 mm, 3 mm, and 10 mm spot sizes
    Powerful and easy-to-use QuantEZ software with multilingual user interface
    60 kV X-ray tube for wide elemental coverage
    60 kV X-ray tube for wide elemental coverage
    Multiple automated tube filters for enhanced sensitivity
    Advanced RPF-SQX Fundamentals Parameters software featuring Rigaku Scattering FP
    See Specifications for options

    NEX DE VS Videos

    NEX DE VS Specifications

    Technique Direct excitation energy dispersive X-ray fluorescence (EDXRF)
    Benefit Integrated camera and small spot analysis; analyze solids, liquids, powders, coatings, and thin films
    Technology Energy dispersive XRF (EDXRF) using a high-performance silicon drift detector (SDD) and integrated high-resolution camera
    Attributes 60 kV 12 W X-ray tube, high-performance SDD, analyze Na to U, precise positioning of samples to analyze 1 mm, 3 mm, and 10 mm spot sizes
    Software QuantEZ for control of spectrometer functions and data analysis
    Options Helium purge, automatic sample changers, single-position sample spinner, external PC with Microsoft® Windows® operating system, UPS, RPF-SQX Fundamental Parameters with Rigaku Scattering FP, SureDI support for 21 CFR Part 11 compliance, other software features
    Dimensions 356 (W) x 260 (H) x 351 (D) mm
    Mass Approx. 27 kg (core unit)
    Power requirements 1Ø, 100 – 240 V, 1.5 A (50/60 Hz)

    NEX DE VS Application Notes

    The following application notes are relevant to this product

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