Silicone Coatings Analysis
Insufficient or excessive silicone application on paper and plastic substrates can significantly alter the release characteristics of a product, such as labels or packaging. EDXRF is a widely used technique for analyzing silicone coatings because it offers a fast, simple, and cost-effective way to measure silicone coat weight in just seconds. It helps manufacturers ensure consistent product quality, minimize waste, and optimize production processes.
Whether you are in packaging, labeling, or any other industry using silicone coatings, EDXRF can be an invaluable tool for quality control and process improvement. With its ease of use, affordability, and ability to handle even very low silicone coating weights, EDXRF is an attractive choice for businesses of all sizes.
Learn more about our at-line and in-line solutions for determining silicone coating thicknesses or coat weight or the elemental composition of a product.
EDXRF provides total quality control solutions
EDXRF, a type of XRF (X-ray fluorescence), has long been a familiar technology for release coatings, converters, vacuum-formed plastics manufacturers, and other industries using silicone oils as barrier layers, release coatings, or denesting agents.
- Total quality control solution for silicone coaters
- Silicone analysis on paper, clay-coated paper, and thin film release liners
- Proprietary silicone on clay-coated paper algorithms
- Specialty films — moisture and air barriers, including high-barrier packaging films
- Printed, metalized, and non-metalized
- Converters – silicone on plastic or paper
- Vacuum-formed plastics – denesting silicone coatings
At-line solutions
For quick at-line analysis, we offer NEX QC Series benchtop analyzers for measuring very low silicone coating weights and metal catalysts in silicone coatings. These systems are compact, do not require an external computer, and are self-maintained. They are a cost-effective solution and provide:
- Rapid silicone coating thickness and composition
- Ultra-low silicone coating weights
- Measurement of Sn, Bi, Ti, Pt, etc., in metal-catalyzed silicone release coatings
- Silicone determination without helium or special sample cups
- Easy sample prep by simply placing a test coupon in the analysis chamber
- Simple, easy operation and built-in printer for convenience
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In-line solutions
NEX LS provides an in-line solution for silicone coat weight profiling for roll-to-roll (R2R) applications. This system offers a detailed visualization of your entire coating process, allowing for immediate quality control decisions and process adjustments without stopping production. It provides:
- Continuous monitoring and control, reducing at-line checks
- Cross-direction and machine-direction data for the entire roll
- Immediate defect detection as the roll is being produced
- Roll reporting and data logging for traceability and audits
- Easy automatic calibration and operation
- Measurement capability for web widths up to 2365 mm
- Consistent performance, regardless of substrate color or composition variations (e.g., clay-coated paper)
Full scanning analysis
Fixed analysis solutions
For quick at-line checks NEX QC Series
Recommended when you need an affordable system for measuring silicone coating thickness and composition. NEX QC and NEX QC+ feature touchscreen operation and built-in printers for added convenience. No external computer is required.
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For in-line analysis NEX LS
Recommended for continuous monitoring and control for roll-to-roll applications. This in-line EDXRF system provides valuable information about the coating’s properties or the product’s composition without stopping production. It provides real-time defect detection and lets you make immediate quality control decisions.
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