Elemental Analysis for Plastics and Polymers
EDXRF technology is a versatile and indispensable tool for the plastics and polymers industry. Different techniques used for elemental analysis can be costly and time-consuming. If you are seeking a more affordable, efficient way to achieve fast, high-quality results without complex setups or extensive sample preparation, EDXRF might be the right choice for you.
It addresses many applications, from analyzing additives and fillers to ensuring compliance with international regulations such as RoHS and ELV directives. EDXRF provides quick qualitative and quantitative elemental analysis, making it an ideal solution for quality control, research and development, and regulatory compliance.
Learn more about how our benchtop EDXRF solutions can help you.
Why choose EDXRF?
Benchtop solutions
We offer a comprehensive range of budget-friendly benchtops, whether your needs are basic or advanced. All systems provide elemental composition data in minutes and do not need ongoing allocations for expensive consumables and maintenance. They are also compact and easily operated with intuitive software that uses a simple interface for step-by-step setup.
Here are some advantages that our systems provide:
- Rapid, non-destructive analysis, beneficial in fast-paced production settings
- Multi-element capabilities, from ultra-low concentrations to percent levels
- Measurement of all elements from sodium (Na) to uranium (U)
- Multi-application versatility for international regulations like RoHS and ELV
- Easy sample preparation and no complex setups, saving you time
- Simple, easy operation, even for non-technical personnel
- Low cost of ownership, self-installed and maintained
Advanced Fundamental Parameters software
Calibration standards can be expensive and difficult to obtain for many applications. With our RPF-SQX Fundamental Parameters (FP) software, the number of required standards is greatly reduced. This option significantly lowers the cost of ownership and reduces your workload requirements.
RPF-SQX, featuring Rigaku Profile Fitting technology and Scattering FP, allows semi-quantitative analysis of almost all sample types without standards and rigorous quantitative analysis with standards. Scattering FP automatically estimates the concentration of unmeasurable low atomic number elements (hydrogen to fluorine) and provides appropriate corrections.
Application examples
Explore our application examples to see if our solutions can benefit your needs.
Recommended products
Solutions for the plastics and polymers industry. Explore the versatility and performance capabilities of Rigaku EDXRF technology.
For routine analysis NEX QC and NEX QC+
Recommended when you need an affordable system for identifying and quantifying the elemental composition of your samples. These systems feature touchscreen operation and built-in printers for added convenience. They have a small footprint, are transportable, and require no external computer.
For analysis with QuantEZ NEX QC+ QuantEZ
Recommended when you need a quick, cost-effective solution with a step up in performance. It includes all the features of the NEX QC Series models but is packaged with QuantEZ software. This software simplifies operations and provides a flow bar interface for creating custom methods. RPF-SQX Fundamental Parameters with Rigaku Profile Fitting is available with this system.
For high-performance analysis NEX DE Series
Recommended when you need expanded analytical capabilities, including higher sample batch throughput, small spot analysis, or enhanced performance for measurement of higher atomic number elements. These systems provide quick elemental identification, screening, and characterization of your samples. RPF-SQX Fundamental Parameters featuring Rigaku Profile Fitting and Scattering FP are available with these systems.
For challenging and complex applications NEX CG II Series
Recommended when you require higher power and increased sensitivity. These systems are ideal for ultra-low and trace-level performance or complex applications with trace elements and variable base matrices. RPF-SQX Fundamental Parameters featuring Rigaku Profile Fitting and Scattering FP are available with these systems.
Information and resources
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