Agricultural Soils and Plant Materials

EDXRF helps you quickly determine the elemental composition of soil and plant materials to identify nutrient levels and check for potential contaminants. Without time-consuming setups or extensive sample preparation, our EDXRF solutions excel in complex applications with trace elements and variable-base matrices, such as testing agricultural soils and crop analysis. Whether you are trying to optimize fertilizer applications or monitoring for toxic metals such as lead, arsenic, cadmium, and mercury, our easy-to-use instruments help you make informed decisions to enhance your crop quality and yield.

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Crops with NEX Series benchtop EDXRF elemental analyzers for composition of soil and plant materials.

Benchtop solutions for assessing soil health and nutrient uptake

Our EDXRF benchtops make managing soil health and monitoring plant nutrient uptake quick and easy, even for demanding trace measurements. Different techniques used for elemental analysis can be costly and time-intensive, challenging if you are operating within budget constraints or need results quickly. Our systems deliver elemental composition data in minutes and do not need ongoing allocations for expensive consumables and maintenance. Here are some advantages that our systems provide:

Rapid, non-destructive elemental analysis
Multi-element capabilities, from ultra-low concentrations to percent levels
Measurement of all elements from sodium (Na) to uranium (U)
Analysis without standards using RPF-SQX Fundamental Parameters
Multi-application versatility, including soil composition and crop analysis
Easy sample preparation, lower cost per sample compared to other techniques
Simple operation with intuitive software, even for non-technical personnel
Low cost of ownership, self-installed and maintained

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Rigaku NEX Series benchtop EDXRF elemental analyzers, including NEX CG II Series, NEX DE Series, and NEX QC Series.

Advanced Fundamental Parameters Software

Advanced qualitative and quantitative analysis is powered by our RPF-SQX FP software, featuring Rigaku Profile Fitting (RPF) technology and Scattering FP. This software allows semi-quantitative analysis of almost all sample types without standards and rigorous quantitative analysis with standards. Scattering FP automatically estimates the concentration of unmeasurable low atomic number elements (hydrogen to fluorine). This feature provides appropriate corrections and is ideal for analyzing soils and plant materials where the composition of the unmeasurable balance of the sample can change significantly from sample to sample. The semi-quantitative measurements can be further optimized using a Matching Library.

Given at least one sample with known concentrations from a referee technique, the software allows you to quickly and easily create a Matching Library. This feature changes the analysis from semi-quant to fully quantitative, tuning your XRF to your specific analysis needs.

Calibration standards can be expensive and difficult to obtain for many applications. With RPF-SQX, the number of required standards is greatly reduced. This option significantly lowers the cost of ownership and reduces your workload requirements.

Rigaku RPF-SQX Fundamental Parameters - FP Method. Using this software, the number of required calibrations is greatly reduced.

Straw with element of interest, iron. Read EDXRF App Note 1425 NEX QC - Analysis of Iron in Straw.

For easy, routine analysis NEX QC Series

Recommended when you need an affordable system for identifying and quantifying the elemental composition of your materials. These compact systems offer exceptional value for analyzing a wide range of sample types. They are designed for ease of use, even for non-technical operators.

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Rigaku NEX QC Series, benchtop EDXRF elemental analyzers.

For quick, high-performance results NEX DE Series

Recommended when you need expanded analytical capabilities, including higher sample batch throughput or enhanced performance for measurement of higher atomic number elements. These systems provide quick elemental identification, screening, and characterization of your samples. RPF-SQX Fundamental Parameters featuring Rigaku Profile Fitting and Scattering FP are available with these systems.

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Rigaku NEX DE Series benchtop EDXRF elemental analyzer with a desktop computer.

For challenging and complex applications NEX CG II Series

Recommended when you require higher power and increased sensitivity. These systems are ideal for ultra-low and trace-level performance or complex applications with trace elements and variable base matrices. RPF-SQX Fundamental Parameters featuring Rigaku Profile Fitting and Scattering FP are available with these systems.

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