About Applied Rigaku Technologies

EDXRF, a primary type of X-ray fluorescence (XRF), provides quick, non-destructive multi-element analysis in a wide range of matrices, even in the most challenging sample types. In general, EDXRF systems are easy to use, have a small footprint, and cost less to operate than other technologies. These advantages make Rigaku EDXRF analyzers attractive systems for many applications.

EDXRF elemental analysis provides one of the simplest, most accurate, and most economical analytical methods for determining the chemical and/or elemental composition of many types of materials. The technique is non-destructive, requires little to no sample preparation, and is well-suited for almost all sample types. Rigaku EDXRF elemental analyzers can be employed to measure a wide range of atomic elements, from sodium (Na) through uranium (U), while providing elemental detection limits from low parts-per-million (ppm) to high weight percent (wt%). In addition to elemental analysis, EDXRF spectrometers may be used to measure the thickness and composition of multi-layer thin films.

Benchtop EDXRF analyzers include the NEX QC Series for routine quality control, the NEX DE Series for more demanding applications or small spot analysis needs, and the NEX CG II Series for complex applications and research.

For real-time process control, the NEX OL process elemental analyzer for liquid streams and the NEX LS scanning multi-element coating analyzer are offered.