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Practical XRD with Confidence #3. XRD for Thin Films: Choosing the Right Measurement for Structure, Strain, and Thickness

Have you applied standard XRD scans to thin films only to find that the results are difficult to interpret or do not answer your real question? If this reflects your experience, this session will help you make better measurement choices.

This session explains how thin film XRD differs from bulk powder diffraction and how to select the right measurement setup for your material and objective. You will learn the physical meaning behind common thin film techniques and how measurement geometry influences what you observe. Examples from polycrystalline and epitaxial films illustrate how to extract meaningful structural information.

 You will learn:

  • When to use θ–2θ scans, rocking curves, and reciprocal space maps

  • How grazing-incidence XRD probes near-surface and ultra-thin films

  • How to assess crystalline quality, strain, and lattice parameters

  • How to match thin film questions to appropriate XRD techniques

Presenter: Keisuke Saito
Rigaku
Director of Application Science
Rigaku
Sales Manager

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