AI Analysis Basic Course - Third Installment: Improvement of Image Quality and Analysis Accuracy of X-ray CT Reconstruction Images by Deep Learning

Hayato Nishizawa and Takumi Ohta

Summer 2026 Volume 42, No. 2 , 06-10

In this article, we present a method for improving the image quality of X-ray CT reconstruction images using deep learning. The method utilizes low- and high-noise X-ray CT reconstruction images acquired with different scanning times as training data to create a model to remove noise patterns from the reconstructions. This noise-reduction method is demonstrated using a battery and a plastic object as examples. We also present analysis results of these images and show that deep learning also improves analysis accuracy.

Highlights

  • Deep learning can substantially reduce noise in X-ray CT reconstruction images from short scans, improving both image quality and the reliability of quantitative analysis.
  • For battery CT, deep-learning processing allowed 4-minute scan data to produce electrode overhang measurements comparable to 17-minute scan data, suggesting a roughly fourfold reduction in scanning time.
  • For a plastic part, a 2-minute scan processed by deep learning produced surface-area measurements close to 40-minute high-quality reference data, indicating the potential for approximately 20-fold faster scanning.

Summary

X-ray CT enables nondestructive three-dimensional observation and quantitative analysis, but high-quality images generally require longer scanning times. Short scans increase image noise, potentially reducing the accuracy of dimensional, structural, and other numerical analyses. This creates a particular challenge for quality assurance and failure analysis, where high throughput and reliable quantitative results are both important.

Deep learning provides a way to improve reconstruction images obtained from short CT scans. A denoising convolutional neural network (DnCNN) can be trained using pairs of relatively noisy and high-quality CT datasets. The model learns to estimate noise patterns in lower-quality data and remove them during inference. Training data can be obtained either from separate short- and long-duration scans or from a single high-quality acquisition reconstructed using different numbers of projection images. The latter approach also minimizes problems caused by sample drift between acquisitions.

Tests with a cylindrical battery demonstrated that processing 4-minute CT data dramatically reduced noise and improved contrast-to-noise ratio (CNR). The battery CNR increased from 5.2 before inference to 38.2 after inference. More importantly, electrode overhang measurement improved from 0.64 mm to 0.59 mm, matching the result obtained from the 17-minute high-quality dataset. This indicates that deep learning can improve quantitative analysis, rather than simply making CT images appear cleaner.

Similar results were obtained with a plastic part. CNR for a 2-minute scan increased from 10.6 to 280 after processing. The calculated surface area improved from 2,956 mm² before inference to 2,821 mm² afterward, compared with 2,836 mm² for the high-quality reference dataset. This suggests that a 2-minute scan combined with deep learning can approach the analytical accuracy of data requiring approximately 40 minutes to acquire.

Deep-learning CT denoising therefore offers a potential route to much higher inspection throughput without sacrificing quantitative accuracy. Models may also be transferable beyond the instrument used to generate their training data. For example, high-quality synchrotron CT data could potentially be used for model training and then applied to laboratory or manufacturing CT datasets.

Frequently asked questions

Deep learning can be trained to recognize and remove noise patterns from X-ray CT reconstruction images. A denoising convolutional neural network can learn from lower-quality and higher-quality versions of CT datasets, estimating the noise present in the lower-quality data. Once trained, the model applies this knowledge to noisy CT datasets and subtracts the estimated noise.

This approach is particularly useful for CT images acquired with short scanning times. Faster scanning normally produces greater noise, making structural boundaries harder to distinguish and potentially reducing quantitative analysis accuracy. Deep-learning processing can improve contrast-to-noise ratio and make structural features easier to separate while retaining the throughput advantages of short scans.

Deep learning can substantially reduce the scanning time required to obtain data suitable for quantitative analysis. In testing with a cylindrical battery, CT data acquired in 4 minutes and processed using a trained denoising model produced an electrode overhang measurement of 0.59 mm. This was identical to the result obtained from higher-quality data acquired over 17 minutes.

For a plastic component, a 2-minute scan processed with deep learning produced a surface-area measurement close to the reference measurement obtained from data corresponding to a 40-minute acquisition. These results indicate potential scanning-time reductions of approximately fourfold for the battery and 20-fold for the plastic component while maintaining comparable analytical accuracy.

A denoising convolutional neural network can be trained using paired CT datasets representing relatively noisy and high-quality images. The lower-quality dataset serves as the coarse training data, while the higher-quality dataset provides the target the model attempts to reproduce.

The model applies convolution and batch normalization to the coarse data to estimate its noise. The estimated noise is subtracted from the coarse image, and the network is repeatedly refined so that the resulting image approaches the high-quality training data. In this work, a two-dimensional DnCNN with a 10-layer convolution and batch-normalization kernel was trained over 20 epochs. Once trained, the model can process a CT dataset in a few seconds to a few minutes.

Two approaches can generate the coarse and fine datasets needed for model training. One approach uses two scans of the same sample: a short scan provides the noisy or coarse dataset, while a longer scan provides the high-quality or fine dataset.

An alternative requires only one high-quality acquisition. The complete set of projection images is reconstructed to create the fine dataset, while a subset of those projections is used to reconstruct a lower-quality version. For the plastic-part example, 2,400 projection images produced the fine dataset, while only 120 regularly sampled projections were used for the coarse dataset. Using one acquisition for both datasets also reduces potential discrepancies caused by sample drift between separate scans.

Deep learning can improve the ability to distinguish internal battery components and make quantitative measurements from rapidly acquired CT data. One important application is measuring electrode overhang, which is relevant because winding misalignment can contribute to internal short circuits and potentially lead to fire.

For a cylindrical battery, deep-learning processing increased the contrast-to-noise ratio from 5.2 in the original 4-minute dataset to 38.2. Noise reduction also allowed the electrode shape to be extracted more accurately. The measured overhang changed from 0.64 mm before processing to 0.59 mm afterward, matching the 0.59 mm measurement obtained from a 17-minute high-quality scan.

Short CT scans can introduce noise that makes the surface of a plastic component appear artificially rough. Because surface-area calculations incorporate this apparent roughness, noise can cause the calculated area to be larger than its actual value.

For a plastic component scanned for 2 minutes, the calculated surface area was 2,956 mm² before deep-learning processing. After processing, it decreased to 2,821 mm², much closer to the 2,836 mm² value obtained from the high-quality reference dataset. The contrast-to-noise ratio simultaneously increased from 10.6 to 280. This demonstrates that denoising can improve both image quality and quantitative measurements used to evaluate characteristics such as surface roughness and molding defects.

A model does not necessarily have to be trained and applied using the same CT instrument. Deep-learning models are expected to generalize to sufficiently similar samples and datasets, creating the possibility of using very high-quality data from one system as training data for images acquired elsewhere.

One potential approach is to train a model using high-quality synchrotron CT data and then apply that model to CT data collected with laboratory or manufacturing instruments. This could potentially improve laboratory or production CT datasets toward the quality obtainable at synchrotron facilities, although the demonstrated battery and plastic examples used the same CT instrument for both training and inference.

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