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AI Analysis Basic Course - Third Installment: Improvement of Image Quality and Analysis Accuracy of X-ray CT Reconstruction Images by Deep Learning

Hayato Nishizawa and Takumi Ohta

Summer 2026 Volume 42, No. 2 , 06-10

In this article, we present a method for improving the image quality of X-ray CT reconstruction images using deep learning. The method utilizes low- and high-noise X-ray CT reconstruction images acquired with different scanning times as training data to create a model to remove noise patterns from the reconstructions. This noise-reduction method is demonstrated using a battery and a plastic object as examples. We also present analysis results of these images and show that deep learning also improves analysis accuracy.

Highlights

  • Deep learning can substantially reduce noise in X-ray CT reconstruction images from short scans, improving both image quality and the reliability of quantitative analysis.
  • For battery CT, deep-learning processing allowed 4-minute scan data to produce electrode overhang measurements comparable to 17-minute scan data, suggesting a roughly fourfold reduction in scanning time.
  • For a plastic part, a 2-minute scan processed by deep learning produced surface-area measurements close to 40-minute high-quality reference data, indicating the potential for approximately 20-fold faster scanning.

Summary

X-ray CT enables nondestructive three-dimensional observation and quantitative analysis, but high-quality images generally require longer scanning times. Short scans increase image noise, potentially reducing the accuracy of dimensional, structural, and other numerical analyses. This creates a particular challenge for quality assurance and failure analysis, where high throughput and reliable quantitative results are both important.

Deep learning provides a way to improve reconstruction images obtained from short CT scans. A denoising convolutional neural network (DnCNN) can be trained using pairs of relatively noisy and high-quality CT datasets. The model learns to estimate noise patterns in lower-quality data and remove them during inference. Training data can be obtained either from separate short- and long-duration scans or from a single high-quality acquisition reconstructed using different numbers of projection images. The latter approach also minimizes problems caused by sample drift between acquisitions.

Tests with a cylindrical battery demonstrated that processing 4-minute CT data dramatically reduced noise and improved contrast-to-noise ratio (CNR). The battery CNR increased from 5.2 before inference to 38.2 after inference. More importantly, electrode overhang measurement improved from 0.64 mm to 0.59 mm, matching the result obtained from the 17-minute high-quality dataset. This indicates that deep learning can improve quantitative analysis, rather than simply making CT images appear cleaner.

Similar results were obtained with a plastic part. CNR for a 2-minute scan increased from 10.6 to 280 after processing. The calculated surface area improved from 2,956 mm² before inference to 2,821 mm² afterward, compared with 2,836 mm² for the high-quality reference dataset. This suggests that a 2-minute scan combined with deep learning can approach the analytical accuracy of data requiring approximately 40 minutes to acquire.

Deep-learning CT denoising therefore offers a potential route to much higher inspection throughput without sacrificing quantitative accuracy. Models may also be transferable beyond the instrument used to generate their training data. For example, high-quality synchrotron CT data could potentially be used for model training and then applied to laboratory or manufacturing CT datasets.

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