- Registration
- Program
- Presenters
- Location
Author |
Title |
Dr. Carsten Richter |
Lab-Based, Quantitative X-ray Diffraction Imaging Using the Rigaku Smartlab Diffractometer |
Dr. Vladimir Kaganer |
X-ray Diffraction from Dislocations in Epitaxial Films |
Dr. Vladimir Kaganer |
Crystal Truncation Rods from Superlattices: How to Calculate Them Properly |
Dr. Edith Bellet-Amalric |
Thin Films and Nanostructures: Out-of-Plane and In-Plane X-ray Diffraction Using the Smartlab |
Dr. Dave Rogers |
X-ray Diffraction for the Development and Quality Control of Oxide Epiwafers |
Dr. Davide Altamura |
Multiscale Characterization of Nano/Bio-Materials by Advanced X-ray Scattering Techniques from Laboratory Sources |
Dr. Sandrine Tusseu-Nenez |
Nanoscale Materials Analyses by X-ray |
Dr. Thomas Cornelius |
Structural Analysis of Accumulative Roll Bonded Cu/Nb Nanolaminates Using X-ray Diffraction Techniques |
Dr. Anna Eden Kossoy |
Characterization of Surface Guided Xanthine Derivatives for Optical Metamaterial Application |
Dr. Anna Eden Kossoy |
Optical and Structural Properties of Ultra-Thin Gold Films |
Dr. Anna Eden Kossoy |
Strain Relaxation and Order-Disorder Phase Transition in Irradiated MgAl2O4 Spinel |
Dr. Lutz Kirste |
Bragg Diffraction Imaging of Defects in GaN Crystal - Laboratory XRT vs. Synchrotron Rocking Curve Imaging |
Dr. Olaf Soltwedel |
Specular and non-specular x-ray reflectometry at the free liquid/air interface |
Prof. Vaclav Holy |
Martensitic beta-to-omega transformation in Ti alloys - an x-ray scattering study |
For more information please contact:
Dr. Artem Shalimov at Artem.Shalimov@Rigaku.com